Electronics reliability and measurement technology: nondestructive evaluation
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| Format: | Electronic Conference Proceeding eBook |
|---|---|
| Language: | English |
| Published: |
Park Ridge, NJ
Noyes Data Corp.
1988
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| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Literaturangaben |
| Physical Description: | 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) |
| ISBN: | 9781591240518 9780815511717 081551171X 9780815517009 |
Staff View
MARC
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Record in the Search Index
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| format | Electronic Conference Proceeding eBook |
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| genre | (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content |
| genre_facet | Konferenzschrift 1986 Hampton Va. |
| id | DE-604.BV023048029 |
| illustrated | Illustrated |
| index_date | 2024-07-02T19:23:25Z |
| indexdate | 2024-07-31T01:10:23Z |
| institution | BVB |
| institution_GND | (DE-588)670898-5 |
| isbn | 9781591240518 9780815511717 081551171X 9780815517009 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016251455 |
| oclc_num | 731736609 |
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| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) |
| psigel | ZDB-10-ESC |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Noyes Data Corp. |
| record_format | marc |
| spelling | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman Park Ridge, NJ Noyes Data Corp. 1988 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) txt rdacontent c rdamedia cr rdacarrier Literaturangaben Elektrotechnologie (DE-588)4336036-1 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content Zuverlässigkeit (DE-588)4059245-5 s Elektronik (DE-588)4014346-6 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Elektrotechnologie (DE-588)4336036-1 s Heyman, Joseph S. Sonstige oth Electronics Reliability and Measurement Technology Workshop 1986 Hampton, Va. Sonstige (DE-588)670898-5 oth http://knovel.com/knovel2/Toc.jsp?BookID=83 Volltext |
| spellingShingle | Electronics reliability and measurement technology nondestructive evaluation Elektrotechnologie (DE-588)4336036-1 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| subject_GND | (DE-588)4336036-1 (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4113419-9 (DE-588)1071861417 |
| title | Electronics reliability and measurement technology nondestructive evaluation |
| title_auth | Electronics reliability and measurement technology nondestructive evaluation |
| title_exact_search | Electronics reliability and measurement technology nondestructive evaluation |
| title_exact_search_txtP | Electronics reliability and measurement technology nondestructive evaluation |
| title_full | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_fullStr | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_full_unstemmed | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_short | Electronics reliability and measurement technology |
| title_sort | electronics reliability and measurement technology nondestructive evaluation |
| title_sub | nondestructive evaluation |
| topic | Elektrotechnologie (DE-588)4336036-1 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| topic_facet | Elektrotechnologie Elektronik Zuverlässigkeit Elektronische Schaltung Konferenzschrift 1986 Hampton Va. |
| url | http://knovel.com/knovel2/Toc.jsp?BookID=83 |
| work_keys_str_mv | AT heymanjosephs electronicsreliabilityandmeasurementtechnologynondestructiveevaluation AT electronicsreliabilityandmeasurementtechnologyworkshophamptonva electronicsreliabilityandmeasurementtechnologynondestructiveevaluation |