Electronics reliability and measurement technology: nondestructive evaluation
Gespeichert in:
| Format: | Elektronisch Tagungsbericht E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Park Ridge, NJ
Noyes Data Corp.
1988
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Literaturangaben |
| Beschreibung: | 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) |
| ISBN: | 9781591240518 9780815511717 081551171X 9780815517009 |
Internformat
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV023048029 | ||
| 003 | DE-604 | ||
| 005 | 20130128 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 071212s1988 |||| o||u| ||||||engod | ||
| 020 | |a 9781591240518 |c Online |9 978-1-59124-051-8 | ||
| 020 | |a 9780815511717 |9 978-0-8155-1171-7 | ||
| 020 | |a 081551171X |9 0-8155-1171-X | ||
| 020 | |a 9780815517009 |c Online |9 978-0-8155-1700-9 | ||
| 035 | |a (OCoLC)731736609 | ||
| 035 | |a (DE-599)BVBBV023048029 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 084 | |a ELT 240f |2 stub | ||
| 245 | 1 | 0 | |a Electronics reliability and measurement technology |b nondestructive evaluation |c ed. by Joseph S. Heyman |
| 264 | 1 | |a Park Ridge, NJ |b Noyes Data Corp. |c 1988 | |
| 300 | |a 1 Online-Ressource (XII, 128 S. |b Ill., graph. Darst.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 0 | 7 | |a Elektrotechnologie |0 (DE-588)4336036-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1986 |z Hampton Va. |2 gnd-content | |
| 689 | 0 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | 1 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 1 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Elektrotechnologie |0 (DE-588)4336036-1 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Heyman, Joseph S. |e Sonstige |4 oth | |
| 711 | 2 | |a Electronics Reliability and Measurement Technology Workshop |d 1986 |c Hampton, Va. |j Sonstige |0 (DE-588)670898-5 |4 oth | |
| 856 | 4 | 0 | |u http://knovel.com/knovel2/Toc.jsp?BookID=83 |3 Volltext |
| 912 | |a ZDB-10-ESC | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-016251455 | |
Datensatz im Suchindex
| _version_ | 1806054954144628737 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV023048029 |
| classification_rvk | ZN 4040 |
| classification_tum | ELT 240f |
| collection | ZDB-10-ESC |
| ctrlnum | (OCoLC)731736609 (DE-599)BVBBV023048029 |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic Conference Proceeding eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000 c 4500</leader><controlfield tag="001">BV023048029</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130128</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">071212s1988 |||| o||u| ||||||engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781591240518</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-59124-051-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780815511717</subfield><subfield code="9">978-0-8155-1171-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">081551171X</subfield><subfield code="9">0-8155-1171-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780815517009</subfield><subfield code="c">Online</subfield><subfield code="9">978-0-8155-1700-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)731736609</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV023048029</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electronics reliability and measurement technology</subfield><subfield code="b">nondestructive evaluation</subfield><subfield code="c">ed. by Joseph S. Heyman</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Park Ridge, NJ</subfield><subfield code="b">Noyes Data Corp.</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XII, 128 S.</subfield><subfield code="b">Ill., graph. Darst.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrotechnologie</subfield><subfield code="0">(DE-588)4336036-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1986</subfield><subfield code="z">Hampton Va.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Elektrotechnologie</subfield><subfield code="0">(DE-588)4336036-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Heyman, Joseph S.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Electronics Reliability and Measurement Technology Workshop</subfield><subfield code="d">1986</subfield><subfield code="c">Hampton, Va.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)670898-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://knovel.com/knovel2/Toc.jsp?BookID=83</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016251455</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content |
| genre_facet | Konferenzschrift 1986 Hampton Va. |
| id | DE-604.BV023048029 |
| illustrated | Illustrated |
| index_date | 2024-07-02T19:23:25Z |
| indexdate | 2024-07-31T01:10:23Z |
| institution | BVB |
| institution_GND | (DE-588)670898-5 |
| isbn | 9781591240518 9780815511717 081551171X 9780815517009 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016251455 |
| oclc_num | 731736609 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) |
| psigel | ZDB-10-ESC |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Noyes Data Corp. |
| record_format | marc |
| spelling | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman Park Ridge, NJ Noyes Data Corp. 1988 1 Online-Ressource (XII, 128 S. Ill., graph. Darst.) txt rdacontent c rdamedia cr rdacarrier Literaturangaben Elektrotechnologie (DE-588)4336036-1 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content Zuverlässigkeit (DE-588)4059245-5 s Elektronik (DE-588)4014346-6 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Elektrotechnologie (DE-588)4336036-1 s Heyman, Joseph S. Sonstige oth Electronics Reliability and Measurement Technology Workshop 1986 Hampton, Va. Sonstige (DE-588)670898-5 oth http://knovel.com/knovel2/Toc.jsp?BookID=83 Volltext |
| spellingShingle | Electronics reliability and measurement technology nondestructive evaluation Elektrotechnologie (DE-588)4336036-1 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| subject_GND | (DE-588)4336036-1 (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4113419-9 (DE-588)1071861417 |
| title | Electronics reliability and measurement technology nondestructive evaluation |
| title_auth | Electronics reliability and measurement technology nondestructive evaluation |
| title_exact_search | Electronics reliability and measurement technology nondestructive evaluation |
| title_exact_search_txtP | Electronics reliability and measurement technology nondestructive evaluation |
| title_full | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_fullStr | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_full_unstemmed | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_short | Electronics reliability and measurement technology |
| title_sort | electronics reliability and measurement technology nondestructive evaluation |
| title_sub | nondestructive evaluation |
| topic | Elektrotechnologie (DE-588)4336036-1 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| topic_facet | Elektrotechnologie Elektronik Zuverlässigkeit Elektronische Schaltung Konferenzschrift 1986 Hampton Va. |
| url | http://knovel.com/knovel2/Toc.jsp?BookID=83 |
| work_keys_str_mv | AT heymanjosephs electronicsreliabilityandmeasurementtechnologynondestructiveevaluation AT electronicsreliabilityandmeasurementtechnologyworkshophamptonva electronicsreliabilityandmeasurementtechnologynondestructiveevaluation |