Verfügbarkeit: Structural, syntactic, and statistical pattern recognition

Structural, syntactic, and statistical pattern recognition: joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings

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Bibliographische Detailangaben
Format:	Elektronisch Tagungsbericht E-Book
Sprache:	English
Veröffentlicht:	Berlin [u.a.] Springer 2006
Schriftenreihe:	Lecture notes in computer science 4109
Schlagworte:	Mustererkennung Konferenzschrift > 2006 > Hongkong
Online-Zugang:	DE-634 DE-M347 DE-91 DE-384 DE-473 DE-19 DE-355 DE-706 DE-739 Volltext
Beschreibung:	1 Online-Ressource (XXI, 939 S.) Ill., graph. Darst.
ISBN:	3540372369 9783540372363
DOI:	10.1007/11815921

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doi_str_mv	10.1007/11815921
format	Electronic Conference Proceeding eBook
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index_date	2024-07-02T17:47:52Z
indexdate	2025-01-10T15:08:53Z
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isbn	3540372369 9783540372363
language	English
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series	Lecture notes in computer science
series2	Lecture notes in computer science
spelling	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.) Berlin [u.a.] Springer 2006 1 Online-Ressource (XXI, 939 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Lecture notes in computer science 4109 Mustererkennung (DE-588)4040936-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2006 Hongkong gnd-content Mustererkennung (DE-588)4040936-3 s DE-604 Yeung, Dit-Yan Sonstige oth SSPR 11 2006 Hongkong Sonstige (DE-588)6058518-3 oth SPR 6 2006 Hongkong Sonstige (DE-588)6058520-1 oth Lecture notes in computer science 4109 (DE-604)BV014880109 4109 https://doi.org/10.1007/11815921 Verlag Volltext
spellingShingle	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Lecture notes in computer science Mustererkennung (DE-588)4040936-3 gnd
subject_GND	(DE-588)4040936-3 (DE-588)1071861417
title	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
title_auth	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
title_exact_search	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
title_exact_search_txtP	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
title_full	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.)
title_fullStr	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.)
title_full_unstemmed	Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.)
title_short	Structural, syntactic, and statistical pattern recognition
title_sort	structural syntactic and statistical pattern recognition joint iapr international workshops sspr 2006 and spr 2006 hong kong china august 17 19 2006 proceedings
title_sub	joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
topic	Mustererkennung (DE-588)4040936-3 gnd
topic_facet	Mustererkennung Konferenzschrift 2006 Hongkong
url	https://doi.org/10.1007/11815921
volume_link	(DE-604)BV014880109
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