(2004). Test and design-for-testability in mixed-signal integrated circuits. Kluwer Academic.
Chicago Style (17th ed.) CitationTest and Design-for-testability in Mixed-signal Integrated Circuits. Boston, Mass. [u.a.]: Kluwer Academic, 2004.
MLA (9th ed.) CitationTest and Design-for-testability in Mixed-signal Integrated Circuits. Kluwer Academic, 2004.
Warning: These citations may not always be 100% accurate.