APA (7th ed.) Citation

(2004). Test and design-for-testability in mixed-signal integrated circuits. Kluwer Academic.

Chicago Style (17th ed.) Citation

Test and Design-for-testability in Mixed-signal Integrated Circuits. Boston, Mass. [u.a.]: Kluwer Academic, 2004.

MLA (9th ed.) Citation

Test and Design-for-testability in Mixed-signal Integrated Circuits. Kluwer Academic, 2004.

Warning: These citations may not always be 100% accurate.