Test and design-for-testability in mixed-signal integrated circuits:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston, Mass. [u.a.]
Kluwer Academic
2004
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references. - Formerly CIP |
| Beschreibung: | XIV, 298 S. graph. Darst. 25cm |
| ISBN: | 1402077246 |
Internformat
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| 245 | 1 | 0 | |a Test and design-for-testability in mixed-signal integrated circuits |c ed. by José L. Huertas |
| 264 | 1 | |a Boston, Mass. [u.a.] |b Kluwer Academic |c 2004 | |
| 300 | |a XIV, 298 S. |b graph. Darst. |c 25cm | ||
| 336 | |b txt |2 rdacontent | ||
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| 500 | |a Includes bibliographical references. - Formerly CIP | ||
| 650 | 7 | |a Circuits intégrés |2 ram | |
| 650 | 7 | |a Traitement du signal |2 ram | |
| 650 | 4 | |a Integrated circuits |x Verification | |
| 650 | 4 | |a Mixed signal circuits |x Design and construction | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Funktionstest |0 (DE-588)4155698-7 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a Huertas, Jose L. |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| genre_facet | Bibliografie |
| id | DE-604.BV022431726 |
| illustrated | Illustrated |
| index_date | 2024-07-02T17:29:36Z |
| indexdate | 2024-07-09T20:57:28Z |
| institution | BVB |
| isbn | 1402077246 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015639924 |
| oclc_num | 53962847 |
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| owner_facet | DE-1043 |
| physical | XIV, 298 S. graph. Darst. 25cm |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | Kluwer Academic |
| record_format | marc |
| spelling | Test and design-for-testability in mixed-signal integrated circuits ed. by José L. Huertas Boston, Mass. [u.a.] Kluwer Academic 2004 XIV, 298 S. graph. Darst. 25cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references. - Formerly CIP Circuits intégrés ram Traitement du signal ram Integrated circuits Verification Mixed signal circuits Design and construction Mixed signal circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Funktionstest (DE-588)4155698-7 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf (DE-588)4006432-3 Bibliografie gnd-content Integrierte Schaltung (DE-588)4027242-4 s Schaltungsentwurf (DE-588)4179389-4 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Funktionstest (DE-588)4155698-7 s DE-604 Huertas, Jose L. Sonstige oth |
| spellingShingle | Test and design-for-testability in mixed-signal integrated circuits Circuits intégrés ram Traitement du signal ram Integrated circuits Verification Mixed signal circuits Design and construction Mixed signal circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Schaltungsentwurf (DE-588)4179389-4 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4155698-7 (DE-588)4756481-7 (DE-588)4179389-4 (DE-588)4006432-3 |
| title | Test and design-for-testability in mixed-signal integrated circuits |
| title_auth | Test and design-for-testability in mixed-signal integrated circuits |
| title_exact_search | Test and design-for-testability in mixed-signal integrated circuits |
| title_exact_search_txtP | Test and design-for-testability in mixed-signal integrated circuits |
| title_full | Test and design-for-testability in mixed-signal integrated circuits ed. by José L. Huertas |
| title_fullStr | Test and design-for-testability in mixed-signal integrated circuits ed. by José L. Huertas |
| title_full_unstemmed | Test and design-for-testability in mixed-signal integrated circuits ed. by José L. Huertas |
| title_short | Test and design-for-testability in mixed-signal integrated circuits |
| title_sort | test and design for testability in mixed signal integrated circuits |
| topic | Circuits intégrés ram Traitement du signal ram Integrated circuits Verification Mixed signal circuits Design and construction Mixed signal circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Schaltungsentwurf (DE-588)4179389-4 gnd |
| topic_facet | Circuits intégrés Traitement du signal Integrated circuits Verification Mixed signal circuits Design and construction Mixed signal circuits Testing Integrierte Schaltung Funktionstest Mixed-Signal-Schaltung Schaltungsentwurf Bibliografie |
| work_keys_str_mv | AT huertasjosel testanddesignfortestabilityinmixedsignalintegratedcircuits |