Introduction to advanced system-on-chip test design and optimization:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht
Springer
c2005
|
| Schriftenreihe: | Frontiers in electronic testing
29 |
| Schlagworte: | |
| Online-Zugang: | Publisher description |
| Beschreibung: | Includes bibliographical references (p. [353]-382) and index |
| Beschreibung: | xv, 388 p. ill. 25 cm |
| ISBN: | 1402032072 0387256245 |
Internformat
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV022431525 | ||
| 003 | DE-604 | ||
| 005 | 20081210 | ||
| 007 | t | ||
| 008 | 070521s2005 ne a||| |||| 00||| eng d | ||
| 010 | |a 2006274784 | ||
| 015 | |a GBA553267 |2 dnb | ||
| 020 | |a 1402032072 |c hbk. : acid free paper |9 1-402-03207-2 | ||
| 020 | |a 0387256245 |c ebook |9 0-387-25624-5 | ||
| 035 | |a (OCoLC)60793481 | ||
| 035 | |a (DE-599)BVBBV022431525 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a ne |c NL | ||
| 049 | |a DE-1043 | ||
| 050 | 0 | |a TK7895.E42 | |
| 082 | 0 | |a 621.3815 | |
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 100 | 1 | |a Larsson, Erik |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Introduction to advanced system-on-chip test design and optimization |c by Erik Larsson |
| 264 | 1 | |a Dordrecht |b Springer |c c2005 | |
| 300 | |a xv, 388 p. |b ill. |c 25 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing |v 29 | |
| 500 | |a Includes bibliographical references (p. [353]-382) and index | ||
| 650 | 4 | |a Systems on a chip |x Testing | |
| 650 | 4 | |a Integrated circuits |x Design and construction | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a System-on-Chip |0 (DE-588)4740357-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehlererkennung |0 (DE-588)4133764-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a System-on-Chip |0 (DE-588)4740357-3 |D s |
| 689 | 0 | 1 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 0 | 2 | |a Fehlererkennung |0 (DE-588)4133764-5 |D s |
| 689 | 0 | 3 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0663/2006274784-d.html |3 Publisher description | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015639699 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804136504680775680 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Larsson, Erik |
| author_facet | Larsson, Erik |
| author_role | aut |
| author_sort | Larsson, Erik |
| author_variant | e l el |
| building | Verbundindex |
| bvnumber | BV022431525 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.E42 |
| callnumber-search | TK7895.E42 |
| callnumber-sort | TK 47895 E42 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4030 |
| ctrlnum | (OCoLC)60793481 (DE-599)BVBBV022431525 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01905nam a2200517zcb4500</leader><controlfield tag="001">BV022431525</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20081210 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">070521s2005 ne a||| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2006274784</subfield></datafield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBA553267</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1402032072</subfield><subfield code="c">hbk. : acid free paper</subfield><subfield code="9">1-402-03207-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387256245</subfield><subfield code="c">ebook</subfield><subfield code="9">0-387-25624-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)60793481</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022431525</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">ne</subfield><subfield code="c">NL</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1043</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.E42</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Larsson, Erik</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Introduction to advanced system-on-chip test design and optimization</subfield><subfield code="c">by Erik Larsson</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dordrecht</subfield><subfield code="b">Springer</subfield><subfield code="c">c2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xv, 388 p.</subfield><subfield code="b">ill.</subfield><subfield code="c">25 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">29</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [353]-382) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems on a chip</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Design and construction</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">System-on-Chip</subfield><subfield code="0">(DE-588)4740357-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlererkennung</subfield><subfield code="0">(DE-588)4133764-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">System-on-Chip</subfield><subfield code="0">(DE-588)4740357-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Fehlererkennung</subfield><subfield code="0">(DE-588)4133764-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.loc.gov/catdir/enhancements/fy0663/2006274784-d.html</subfield><subfield code="3">Publisher description</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015639699</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV022431525 |
| illustrated | Illustrated |
| index_date | 2024-07-02T17:29:30Z |
| indexdate | 2024-07-09T20:57:27Z |
| institution | BVB |
| isbn | 1402032072 0387256245 |
| language | English |
| lccn | 2006274784 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015639699 |
| oclc_num | 60793481 |
| open_access_boolean | |
| owner | DE-1043 |
| owner_facet | DE-1043 |
| physical | xv, 388 p. ill. 25 cm |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Springer |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Larsson, Erik Verfasser aut Introduction to advanced system-on-chip test design and optimization by Erik Larsson Dordrecht Springer c2005 xv, 388 p. ill. 25 cm txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 29 Includes bibliographical references (p. [353]-382) and index Systems on a chip Testing Integrated circuits Design and construction Testen (DE-588)4367264-4 gnd rswk-swf System-on-Chip (DE-588)4740357-3 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf System-on-Chip (DE-588)4740357-3 s Integrierte Schaltung (DE-588)4027242-4 s Fehlererkennung (DE-588)4133764-5 s Testen (DE-588)4367264-4 s 1\p DE-604 http://www.loc.gov/catdir/enhancements/fy0663/2006274784-d.html Publisher description 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Larsson, Erik Introduction to advanced system-on-chip test design and optimization Systems on a chip Testing Integrated circuits Design and construction Testen (DE-588)4367264-4 gnd System-on-Chip (DE-588)4740357-3 gnd Fehlererkennung (DE-588)4133764-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4740357-3 (DE-588)4133764-5 (DE-588)4027242-4 |
| title | Introduction to advanced system-on-chip test design and optimization |
| title_auth | Introduction to advanced system-on-chip test design and optimization |
| title_exact_search | Introduction to advanced system-on-chip test design and optimization |
| title_exact_search_txtP | Introduction to advanced system-on-chip test design and optimization |
| title_full | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_fullStr | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_full_unstemmed | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_short | Introduction to advanced system-on-chip test design and optimization |
| title_sort | introduction to advanced system on chip test design and optimization |
| topic | Systems on a chip Testing Integrated circuits Design and construction Testen (DE-588)4367264-4 gnd System-on-Chip (DE-588)4740357-3 gnd Fehlererkennung (DE-588)4133764-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| topic_facet | Systems on a chip Testing Integrated circuits Design and construction Testen System-on-Chip Fehlererkennung Integrierte Schaltung |
| url | http://www.loc.gov/catdir/enhancements/fy0663/2006274784-d.html |
| work_keys_str_mv | AT larssonerik introductiontoadvancedsystemonchiptestdesignandoptimization |