Reliability of electron devices, failure physics and analysis: [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]]
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Orlando, Fla. [u.a.]
Elsevier
2005
|
| Schriftenreihe: | Microelectronics reliability
45,9/11 : Special issue |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zs.-Heftes |
| Beschreibung: | S.1277 - 1806 Ill., graph. Darst. |
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| index_date | 2024-07-02T17:27:37Z |
| indexdate | 2024-07-09T20:57:20Z |
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| physical | S.1277 - 1806 Ill., graph. Darst. |
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| spelling | ESREF 16 2005 Arcachon Verfasser (DE-588)6045664-4 aut Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] guest ed. N. Labat ... Orlando, Fla. [u.a.] Elsevier 2005 S.1277 - 1806 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microelectronics reliability 45,9/11 : Special issue Einzelaufnahme eines Zs.-Heftes Schaden (DE-588)4125902-6 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Netzwerkanalyse (DE-588)4075298-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Netzwerkanalyse (DE-588)4075298-7 s Elektronische Schaltung (DE-588)4113419-9 s Schaden (DE-588)4125902-6 s DE-604 Labat, Nathalie Sonstige oth |
| spellingShingle | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] Schaden (DE-588)4125902-6 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Netzwerkanalyse (DE-588)4075298-7 gnd |
| subject_GND | (DE-588)4125902-6 (DE-588)4113419-9 (DE-588)4075298-7 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] |
| title_auth | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] |
| title_exact_search | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] |
| title_full | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] guest ed. N. Labat ... |
| title_fullStr | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] guest ed. N. Labat ... |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] guest ed. N. Labat ... |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis the 16th european symposium on reliability of electron devices failure physics and analysis esref 2005 will be held in arcachon near bordeaux france from october 10th to 14th 2005 |
| title_sub | [The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Arcachon, near Bordeaux (France) from October 10th to 14th, 2005]] |
| topic | Schaden (DE-588)4125902-6 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Netzwerkanalyse (DE-588)4075298-7 gnd |
| topic_facet | Schaden Elektronische Schaltung Netzwerkanalyse Konferenzschrift |
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