Extended defects in semiconductors: electronic properties, device effects and structures
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge [u.a.]
Cambridge University Press
2007
|
| Ausgabe: | 1. publ. |
| Schlagworte: | |
| Online-Zugang: | Table of contents only Publisher description |
| Beschreibung: | Hier auch später erschienene, unveränderte Nachdrucke Includes bibliographical references |
| Beschreibung: | XI, 631 S. Ill., graph. Darst. |
| ISBN: | 9780521819343 0521819342 9781107424142 |
Internformat
MARC
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| 100 | 1 | |a Holt, David B. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Extended defects in semiconductors |b electronic properties, device effects and structures |c D. B. Holt ; B. G. Yacobi |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a Cambridge [u.a.] |b Cambridge University Press |c 2007 | |
| 300 | |a XI, 631 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Hier auch später erschienene, unveränderte Nachdrucke | ||
| 500 | |a Includes bibliographical references | ||
| 650 | 4 | |a Semiconducteurs - Défauts | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Yacobi, B. G. |e Verfasser |4 aut | |
| 856 | 4 | |u http://www.loc.gov/catdir/toc/ecip074/2006037298.html |3 Table of contents only | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0703/2006037298-d.html |3 Publisher description | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015586942 | ||
Datensatz im Suchindex
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| bvnumber | BV022377904 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UP 2100 UQ 2400 |
| ctrlnum | (OCoLC)76167306 (DE-599)BVBBV022377904 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. publ. |
| format | Book |
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| id | DE-604.BV022377904 |
| illustrated | Illustrated |
| index_date | 2024-07-02T17:10:02Z |
| indexdate | 2024-07-09T20:56:19Z |
| institution | BVB |
| isbn | 9780521819343 0521819342 9781107424142 |
| language | English |
| lccn | 2006037298 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015586942 |
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| physical | XI, 631 S. Ill., graph. Darst. |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Cambridge University Press |
| record_format | marc |
| spelling | Holt, David B. Verfasser aut Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi 1. publ. Cambridge [u.a.] Cambridge University Press 2007 XI, 631 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Hier auch später erschienene, unveränderte Nachdrucke Includes bibliographical references Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Yacobi, B. G. Verfasser aut http://www.loc.gov/catdir/toc/ecip074/2006037298.html Table of contents only http://www.loc.gov/catdir/enhancements/fy0703/2006037298-d.html Publisher description |
| spellingShingle | Holt, David B. Yacobi, B. G. Extended defects in semiconductors electronic properties, device effects and structures Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4125030-8 |
| title | Extended defects in semiconductors electronic properties, device effects and structures |
| title_auth | Extended defects in semiconductors electronic properties, device effects and structures |
| title_exact_search | Extended defects in semiconductors electronic properties, device effects and structures |
| title_exact_search_txtP | Extended defects in semiconductors electronic properties, device effects and structures |
| title_full | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
| title_fullStr | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
| title_full_unstemmed | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
| title_short | Extended defects in semiconductors |
| title_sort | extended defects in semiconductors electronic properties device effects and structures |
| title_sub | electronic properties, device effects and structures |
| topic | Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Semiconducteurs - Défauts Semiconductors Defects Halbleiter Gitterbaufehler |
| url | http://www.loc.gov/catdir/toc/ecip074/2006037298.html http://www.loc.gov/catdir/enhancements/fy0703/2006037298-d.html |
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