Secondary ion mass spectrometry: basic concepts, instrumental aspects, applications and trends
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Wiley
1987
|
| Ausgabe: | 1.print. |
| Schriftenreihe: | Chemical analysis
86 |
| Schlagworte: | |
| Beschreibung: | XXXV, 1227 S. |
| ISBN: | 0471010561 |
Internformat
MARC
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|---|---|---|---|
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| 008 | 891113s1987 |||| 00||| eng d | ||
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| 100 | 1 | |a Benninghoven, Alfred |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b basic concepts, instrumental aspects, applications and trends |
| 250 | |a 1.print. | ||
| 264 | 1 | |a New York [u.a.] |b Wiley |c 1987 | |
| 300 | |a XXXV, 1227 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Chemical analysis |v 86 | |
| 650 | 7 | |a Espectroscopia De Massa |2 larpcal | |
| 650 | 7 | |a Espectroscopia |2 larpcal | |
| 650 | 4 | |a Spectroscopie de masse des ions secondaires | |
| 650 | 4 | |a Secondary ion mass spectrometry | |
| 650 | 0 | 7 | |a Massenspektrometrie |0 (DE-588)4037882-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ion |0 (DE-588)4027597-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
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| 689 | 2 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Rüdenauer, Friedrich G. |e Verfasser |4 aut | |
| 700 | 1 | |a Werner, H. W. |e Verfasser |4 aut | |
| 830 | 0 | |a Chemical analysis |v 86 |w (DE-604)BV000008780 | |
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Datensatz im Suchindex
| _version_ | 1804136160118702080 |
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| author | Benninghoven, Alfred Rüdenauer, Friedrich G. Werner, H. W. |
| author_facet | Benninghoven, Alfred Rüdenauer, Friedrich G. Werner, H. W. |
| author_role | aut aut aut |
| author_sort | Benninghoven, Alfred |
| author_variant | a b ab f g r fg fgr h w w hw hww |
| building | Verbundindex |
| bvnumber | BV022184410 |
| callnumber-first | Q - Science |
| callnumber-label | QD96 |
| callnumber-raw | QD96.S43 |
| callnumber-search | QD96.S43 |
| callnumber-sort | QD 296 S43 |
| callnumber-subject | QD - Chemistry |
| classification_rvk | VG 9800 |
| ctrlnum | (OCoLC)13525968 (DE-599)BVBBV022184410 |
| dewey-full | 543/.0873 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.0873 |
| dewey-search | 543/.0873 |
| dewey-sort | 3543 3873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| discipline_str_mv | Chemie / Pharmazie |
| edition | 1.print. |
| format | Book |
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| id | DE-604.BV022184410 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:20:53Z |
| indexdate | 2024-07-09T20:51:59Z |
| institution | BVB |
| isbn | 0471010561 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015399176 |
| oclc_num | 13525968 |
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| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XXXV, 1227 S. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| series | Chemical analysis |
| series2 | Chemical analysis |
| spelling | Benninghoven, Alfred Verfasser aut Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends 1.print. New York [u.a.] Wiley 1987 XXXV, 1227 S. txt rdacontent n rdamedia nc rdacarrier Chemical analysis 86 Espectroscopia De Massa larpcal Espectroscopia larpcal Spectroscopie de masse des ions secondaires Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Ion (DE-588)4027597-8 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Ion (DE-588)4027597-8 s DE-604 Massenspektrometrie (DE-588)4037882-2 s Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s 1\p DE-604 Rüdenauer, Friedrich G. Verfasser aut Werner, H. W. Verfasser aut Chemical analysis 86 (DE-604)BV000008780 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Benninghoven, Alfred Rüdenauer, Friedrich G. Werner, H. W. Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends Chemical analysis Espectroscopia De Massa larpcal Espectroscopia larpcal Spectroscopie de masse des ions secondaires Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Ion (DE-588)4027597-8 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4037882-2 (DE-588)4027597-8 (DE-588)4077346-2 |
| title | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_auth | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_exact_search | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_exact_search_txtP | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_full | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_fullStr | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_full_unstemmed | Secondary ion mass spectrometry basic concepts, instrumental aspects, applications and trends |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry basic concepts instrumental aspects applications and trends |
| title_sub | basic concepts, instrumental aspects, applications and trends |
| topic | Espectroscopia De Massa larpcal Espectroscopia larpcal Spectroscopie de masse des ions secondaires Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Ion (DE-588)4027597-8 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Espectroscopia De Massa Espectroscopia Spectroscopie de masse des ions secondaires Secondary ion mass spectrometry Massenspektrometrie Ion Sekundärionen-Massenspektrometrie |
| volume_link | (DE-604)BV000008780 |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometrybasicconceptsinstrumentalaspectsapplicationsandtrends AT rudenauerfriedrichg secondaryionmassspectrometrybasicconceptsinstrumentalaspectsapplicationsandtrends AT wernerhw secondaryionmassspectrometrybasicconceptsinstrumentalaspectsapplicationsandtrends |