Defect complexes in semiconductor structures: proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1983
|
| Schriftenreihe: | Lecture notes in physics
175 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | VI, 307 S. Ill., graph. Darst. |
| ISBN: | 3540119868 0387119868 |
Internformat
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV022146969 | ||
| 003 | DE-604 | ||
| 005 | 20040302000000.0 | ||
| 007 | t | ||
| 008 | 010914s1983 ad|| |||| 10||| eng d | ||
| 020 | |a 3540119868 |9 3-540-11986-8 | ||
| 020 | |a 0387119868 |9 0-387-11986-8 | ||
| 035 | |a (OCoLC)9283402 | ||
| 035 | |a (DE-599)BVBBV022146969 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a QC611.6.D4 | |
| 082 | 0 | |a 621.3815/2 |2 19 | |
| 084 | |a UD 8220 |0 (DE-625)145543: |2 rvk | ||
| 245 | 1 | 0 | |a Defect complexes in semiconductor structures |b proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 1983 | |
| 300 | |a VI, 307 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Lecture notes in physics |v 175 | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Semiconducteurs - Défauts - Congrès | |
| 650 | 4 | |a Semiconductors |x Defects |v Congresses | |
| 650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterphysik |0 (DE-588)4113829-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleitertechnologie |0 (DE-588)4158814-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterphysik |0 (DE-588)4113829-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleitertechnologie |0 (DE-588)4158814-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Störstelle |0 (DE-588)4193400-3 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 3 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 3 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Giber, János |e Sonstige |4 oth | |
| 711 | 2 | |a International School on Defect Complexes in Semiconductor Structures |d 1982 |c Mátrafüred |j Sonstige |0 (DE-588)5001645-3 |4 oth | |
| 830 | 0 | |a Lecture notes in physics |v 175 |w (DE-604)BV000003166 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015361607 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804136120860016640 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV022146969 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.6.D4 |
| callnumber-search | QC611.6.D4 |
| callnumber-sort | QC 3611.6 D4 |
| callnumber-subject | QC - Physics |
| classification_rvk | UD 8220 |
| ctrlnum | (OCoLC)9283402 (DE-599)BVBBV022146969 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02171nam a2200565zcb4500</leader><controlfield tag="001">BV022146969</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040302000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010914s1983 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540119868</subfield><subfield code="9">3-540-11986-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387119868</subfield><subfield code="9">0-387-11986-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)9283402</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022146969</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC611.6.D4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UD 8220</subfield><subfield code="0">(DE-625)145543:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defect complexes in semiconductor structures</subfield><subfield code="b">proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 307 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Lecture notes in physics</subfield><subfield code="v">175</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconducteurs - Défauts - Congrès</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterphysik</subfield><subfield code="0">(DE-588)4113829-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleitertechnologie</subfield><subfield code="0">(DE-588)4158814-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterphysik</subfield><subfield code="0">(DE-588)4113829-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbleitertechnologie</subfield><subfield code="0">(DE-588)4158814-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Giber, János</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International School on Defect Complexes in Semiconductor Structures</subfield><subfield code="d">1982</subfield><subfield code="c">Mátrafüred</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5001645-3</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Lecture notes in physics</subfield><subfield code="v">175</subfield><subfield code="w">(DE-604)BV000003166</subfield><subfield code="9"></subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015361607</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022146969 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:17:57Z |
| indexdate | 2024-07-09T20:51:21Z |
| institution | BVB |
| institution_GND | (DE-588)5001645-3 |
| isbn | 3540119868 0387119868 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015361607 |
| oclc_num | 9283402 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VI, 307 S. Ill., graph. Darst. |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| publisher | Springer |
| record_format | marc |
| series | Lecture notes in physics |
| series2 | Lecture notes in physics |
| spelling | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 Berlin [u.a.] Springer 1983 VI, 307 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Lecture notes in physics 175 Literaturangaben Semiconducteurs - Défauts - Congrès Semiconductors Defects Congresses Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterphysik (DE-588)4113829-6 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleiterphysik (DE-588)4113829-6 s DE-604 Halbleitertechnologie (DE-588)4158814-9 s Störstelle (DE-588)4193400-3 s Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Giber, János Sonstige oth International School on Defect Complexes in Semiconductor Structures 1982 Mátrafüred Sonstige (DE-588)5001645-3 oth Lecture notes in physics 175 (DE-604)BV000003166 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 Lecture notes in physics Semiconducteurs - Défauts - Congrès Semiconductors Defects Congresses Störstelle (DE-588)4193400-3 gnd Halbleiterphysik (DE-588)4113829-6 gnd Halbleitertechnologie (DE-588)4158814-9 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4193400-3 (DE-588)4113829-6 (DE-588)4158814-9 (DE-588)4022993-2 (DE-588)4125030-8 (DE-588)1071861417 |
| title | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_auth | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_exact_search | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_exact_search_txtP | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_full | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_fullStr | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_full_unstemmed | Defect complexes in semiconductor structures proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| title_short | Defect complexes in semiconductor structures |
| title_sort | defect complexes in semiconductor structures proceedings of the international school held in matrafured hungary september 13 17 1982 |
| title_sub | proceedings of the international school held in Matrafüred, Hungary, September 13 - 17, 1982 |
| topic | Semiconducteurs - Défauts - Congrès Semiconductors Defects Congresses Störstelle (DE-588)4193400-3 gnd Halbleiterphysik (DE-588)4113829-6 gnd Halbleitertechnologie (DE-588)4158814-9 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Semiconducteurs - Défauts - Congrès Semiconductors Defects Congresses Störstelle Halbleiterphysik Halbleitertechnologie Halbleiter Gitterbaufehler Konferenzschrift |
| volume_link | (DE-604)BV000003166 |
| work_keys_str_mv | AT giberjanos defectcomplexesinsemiconductorstructuresproceedingsoftheinternationalschoolheldinmatrafuredhungaryseptember13171982 AT internationalschoolondefectcomplexesinsemiconductorstructuresmatrafured defectcomplexesinsemiconductorstructuresproceedingsoftheinternationalschoolheldinmatrafuredhungaryseptember13171982 |