Microelectronics and microscopy:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Boston [u.a.]
Acad. Pr.
1992
|
Ausgabe: | 1. print. |
Schriftenreihe: | Advances in electronics and electron physics
83 |
Schlagworte: | |
Beschreibung: | Einzelaufnahm eines Zeitschr.-Bandes |
Beschreibung: | XI, 282 S. Ill., graph. Darst. |
ISBN: | 0120147254 |
Internformat
MARC
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040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
050 | 0 | |a TK7800 | |
082 | 0 | |a 621.38 |b Ad9, v. 83 | |
245 | 1 | 0 | |a Microelectronics and microscopy |c ed. by Peter W. Hawkes |
250 | |a 1. print. | ||
264 | 1 | |a Boston [u.a.] |b Acad. Pr. |c 1992 | |
300 | |a XI, 282 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Advances in electronics and electron physics |v 83 | |
500 | |a Einzelaufnahm eines Zeitschr.-Bandes | ||
650 | 7 | |a Física geral |2 larpcal | |
650 | 7 | |a Imagerie (technique) |2 ram | |
650 | 7 | |a Lithographie par faisceau d'électrons |2 ram | |
650 | 7 | |a Microscopie électronique à balayage |2 ram | |
650 | 7 | |a Microélectronique |2 ram | |
650 | 4 | |a Imaging systems | |
650 | 4 | |a Lithography, Electron beam | |
650 | 4 | |a Microelectronics | |
650 | 4 | |a Scanning electron microscopy | |
650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Hawkes, Peter W. |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015329014 |
Datensatz im Suchindex
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building | Verbundindex |
bvnumber | BV022114139 |
callnumber-first | T - Technology |
callnumber-label | TK7800 |
callnumber-raw | TK7800 |
callnumber-search | TK7800 |
callnumber-sort | TK 47800 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)26509644 (DE-599)BVBBV022114139 |
dewey-full | 621.38 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.38 |
dewey-search | 621.38 |
dewey-sort | 3621.38 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1. print. |
format | Book |
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id | DE-604.BV022114139 |
illustrated | Illustrated |
index_date | 2024-07-02T16:15:53Z |
indexdate | 2024-07-09T20:50:50Z |
institution | BVB |
isbn | 0120147254 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015329014 |
oclc_num | 26509644 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | XI, 282 S. Ill., graph. Darst. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Acad. Pr. |
record_format | marc |
series2 | Advances in electronics and electron physics |
spelling | Microelectronics and microscopy ed. by Peter W. Hawkes 1. print. Boston [u.a.] Acad. Pr. 1992 XI, 282 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in electronics and electron physics 83 Einzelaufnahm eines Zeitschr.-Bandes Física geral larpcal Imagerie (technique) ram Lithographie par faisceau d'électrons ram Microscopie électronique à balayage ram Microélectronique ram Imaging systems Lithography, Electron beam Microelectronics Scanning electron microscopy Mikroskopie (DE-588)4039238-7 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s DE-604 Mikroskopie (DE-588)4039238-7 s Hawkes, Peter W. Sonstige oth |
spellingShingle | Microelectronics and microscopy Física geral larpcal Imagerie (technique) ram Lithographie par faisceau d'électrons ram Microscopie électronique à balayage ram Microélectronique ram Imaging systems Lithography, Electron beam Microelectronics Scanning electron microscopy Mikroskopie (DE-588)4039238-7 gnd Mikroelektronik (DE-588)4039207-7 gnd |
subject_GND | (DE-588)4039238-7 (DE-588)4039207-7 |
title | Microelectronics and microscopy |
title_auth | Microelectronics and microscopy |
title_exact_search | Microelectronics and microscopy |
title_exact_search_txtP | Microelectronics and microscopy |
title_full | Microelectronics and microscopy ed. by Peter W. Hawkes |
title_fullStr | Microelectronics and microscopy ed. by Peter W. Hawkes |
title_full_unstemmed | Microelectronics and microscopy ed. by Peter W. Hawkes |
title_short | Microelectronics and microscopy |
title_sort | microelectronics and microscopy |
topic | Física geral larpcal Imagerie (technique) ram Lithographie par faisceau d'électrons ram Microscopie électronique à balayage ram Microélectronique ram Imaging systems Lithography, Electron beam Microelectronics Scanning electron microscopy Mikroskopie (DE-588)4039238-7 gnd Mikroelektronik (DE-588)4039207-7 gnd |
topic_facet | Física geral Imagerie (technique) Lithographie par faisceau d'électrons Microscopie électronique à balayage Microélectronique Imaging systems Lithography, Electron beam Microelectronics Scanning electron microscopy Mikroskopie Mikroelektronik |
work_keys_str_mv | AT hawkespeterw microelectronicsandmicroscopy |