Statistical pattern recognition:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Rochelle Park, NJ
Hayden
1973
|
| Ausgabe: | 1. printing |
| Schriftenreihe: | Spartan books
9210 |
| Schlagworte: | |
| Beschreibung: | XVI, 236 S. |
| ISBN: | 0876711778 |
Internformat
MARC
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| 245 | 1 | 0 | |a Statistical pattern recognition |c Chi-hau Chen |
| 250 | |a 1. printing | ||
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| 300 | |a XVI, 236 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 1 | |a Spartan books |v 9210 | |
| 650 | 4 | |a Reconnaissance optique des données | |
| 650 | 4 | |a Pattern perception |x Statistical methods | |
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| 650 | 0 | 7 | |a Statistik |0 (DE-588)4056995-0 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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|---|---|
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| author | Chen, Chi-hau 1937- |
| author_GND | (DE-588)110444965 |
| author_facet | Chen, Chi-hau 1937- |
| author_role | aut |
| author_sort | Chen, Chi-hau 1937- |
| author_variant | c h c chc |
| building | Verbundindex |
| bvnumber | BV022107518 |
| callnumber-first | Q - Science |
| callnumber-label | Q327 |
| callnumber-raw | Q327 |
| callnumber-search | Q327 |
| callnumber-sort | Q 3327 |
| callnumber-subject | Q - General Science |
| classification_rvk | SK 840 |
| ctrlnum | (OCoLC)621954 (DE-599)BVBBV022107518 |
| dewey-full | 001.53 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 001 - Knowledge |
| dewey-raw | 001.53 |
| dewey-search | 001.53 |
| dewey-sort | 11.53 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Allgemeines Mathematik |
| discipline_str_mv | Allgemeines Mathematik |
| edition | 1. printing |
| format | Book |
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| id | DE-604.BV022107518 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:15:36Z |
| indexdate | 2024-07-09T20:50:44Z |
| institution | BVB |
| isbn | 0876711778 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015322395 |
| oclc_num | 621954 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XVI, 236 S. |
| publishDate | 1973 |
| publishDateSearch | 1973 |
| publishDateSort | 1973 |
| publisher | Hayden |
| record_format | marc |
| series | Spartan books |
| series2 | Spartan books |
| spelling | Chen, Chi-hau 1937- Verfasser (DE-588)110444965 aut Statistical pattern recognition Chi-hau Chen 1. printing Rochelle Park, NJ Hayden 1973 XVI, 236 S. txt rdacontent n rdamedia nc rdacarrier Spartan books 9210 Reconnaissance optique des données Pattern perception Statistical methods Mustererkennung (DE-588)4040936-3 gnd rswk-swf Statistik (DE-588)4056995-0 gnd rswk-swf Modelltheorie (DE-588)4114617-7 gnd rswk-swf Statistik (DE-588)4056995-0 s Modelltheorie (DE-588)4114617-7 s 1\p DE-604 Mustererkennung (DE-588)4040936-3 s 2\p DE-604 Spartan books 9210 (DE-604)BV021863808 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Chen, Chi-hau 1937- Statistical pattern recognition Spartan books Reconnaissance optique des données Pattern perception Statistical methods Mustererkennung (DE-588)4040936-3 gnd Statistik (DE-588)4056995-0 gnd Modelltheorie (DE-588)4114617-7 gnd |
| subject_GND | (DE-588)4040936-3 (DE-588)4056995-0 (DE-588)4114617-7 |
| title | Statistical pattern recognition |
| title_auth | Statistical pattern recognition |
| title_exact_search | Statistical pattern recognition |
| title_exact_search_txtP | Statistical pattern recognition |
| title_full | Statistical pattern recognition Chi-hau Chen |
| title_fullStr | Statistical pattern recognition Chi-hau Chen |
| title_full_unstemmed | Statistical pattern recognition Chi-hau Chen |
| title_short | Statistical pattern recognition |
| title_sort | statistical pattern recognition |
| topic | Reconnaissance optique des données Pattern perception Statistical methods Mustererkennung (DE-588)4040936-3 gnd Statistik (DE-588)4056995-0 gnd Modelltheorie (DE-588)4114617-7 gnd |
| topic_facet | Reconnaissance optique des données Pattern perception Statistical methods Mustererkennung Statistik Modelltheorie |
| volume_link | (DE-604)BV021863808 |
| work_keys_str_mv | AT chenchihau statisticalpatternrecognition |