Scanning probe microscopies: from surface structure to nano-scale engineering
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Uetikon-Zuerich [u.a.]
Trans Tech Publ.
2001
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Schriftenreihe: | Materials science foundations
14 |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | Literaturverz. S. 93 - [95] |
Beschreibung: | 94, IV S. Ill., graph. Darst. |
ISBN: | 0878498680 |
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Datensatz im Suchindex
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adam_text | SCANNING PROBE MICROSCOPIES - FROM SURFACE STRUCTURE TO NANO-SCALE
ENGINEERING - A. DE STEFANIS AND A.A.G. TOMLINSON T%) TRANS TECH
PUBLICATIONS LTD SWITZERLAND * GERMANY * UK * USA TABLE OF CONTENTS
CONTENTS 1 SCANNING TUNNELLING MICROSCOPY 1 1.1 INTRODUCTION AND HISTORY
1 1.2 THE PHYSICAL BASIS OF STM .3 1.3 INSTRUMENTATION, PAST AND PRESENT
.6 1.4 STM IMAGE INTERPRETATION 11 1.5 STM SPECTROSCOPY .32 2 ATOMIC
FORCE AND RELATED FORCE MICROSCOPIES 36 2.1 HISTORY 36 2.2 PRINCIPLES
.37 2.3 INSTRUMENTATION AND AN AFM SITTING 42 2.4 OTHER MICROSCOPY
TECHNIQUES COMPARISON .50 2.5 APPLICATIONS OFSPM 52 2.5.1 SCIENTIFIC .52
2.5.1.1 SOLID STATE STRUCTURE 52 2.5.1.2 FILMS, LAYERS COATINGS 54
2.5.1.3 TRIBOLOGY 61 2.5.2 INTERATOMIC FORCES 66 2.5.3 TECHNOLOGICAL .71
2.5.3.1 MICRO AND NANOELECTRONIC 71 2.5.3.2 MAGNETIC FORCE MICROSCOPY
(MFM) 78 2.5.3.3 PLASTICS ANDPOLYMERS 79 2.5.3.4 INDUSTRIAL COATINGS 83
2.5.3.5 NANOFABRICATION 84 2.5.3.6 NEW TECHNIQUES AND THE FUTURE 87 3
REFERENCES 97
|
adam_txt |
SCANNING PROBE MICROSCOPIES - FROM SURFACE STRUCTURE TO NANO-SCALE
ENGINEERING - A. DE STEFANIS AND A.A.G. TOMLINSON T%) TRANS TECH
PUBLICATIONS LTD SWITZERLAND * GERMANY * UK * USA TABLE OF CONTENTS
CONTENTS 1 SCANNING TUNNELLING MICROSCOPY 1 1.1 INTRODUCTION AND HISTORY
1 1.2 THE PHYSICAL BASIS OF STM .3 1.3 INSTRUMENTATION, PAST AND PRESENT
.6 1.4 STM IMAGE INTERPRETATION 11 1.5 STM SPECTROSCOPY .32 2 ATOMIC
FORCE AND RELATED FORCE MICROSCOPIES 36 2.1 HISTORY 36 2.2 PRINCIPLES
.37 2.3 INSTRUMENTATION AND AN AFM SITTING 42 2.4 OTHER MICROSCOPY
TECHNIQUES COMPARISON .50 2.5 APPLICATIONS OFSPM 52 2.5.1 SCIENTIFIC .52
2.5.1.1 SOLID STATE STRUCTURE 52 2.5.1.2 FILMS, LAYERS COATINGS 54
2.5.1.3 TRIBOLOGY 61 2.5.2 INTERATOMIC FORCES 66 2.5.3 TECHNOLOGICAL .71
2.5.3.1 MICRO AND NANOELECTRONIC 71 2.5.3.2 MAGNETIC FORCE MICROSCOPY
(MFM) 78 2.5.3.3 PLASTICS ANDPOLYMERS 79 2.5.3.4 INDUSTRIAL COATINGS 83
2.5.3.5 NANOFABRICATION 84 2.5.3.6 NEW TECHNIQUES AND THE FUTURE 87 3
REFERENCES 97 |
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author | DeStefanis, A. Tomlinson, Anthony A. G. |
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ctrlnum | (OCoLC)248239156 (DE-599)BVBBV022084871 |
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illustrated | Illustrated |
index_date | 2024-07-02T16:14:30Z |
indexdate | 2024-07-09T20:50:24Z |
institution | BVB |
isbn | 0878498680 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015299695 |
oclc_num | 248239156 |
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owner | DE-706 |
owner_facet | DE-706 |
physical | 94, IV S. Ill., graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | Trans Tech Publ. |
record_format | marc |
series | Materials science foundations |
series2 | Materials science foundations |
spelling | DeStefanis, A. Verfasser aut Scanning probe microscopies from surface structure to nano-scale engineering Uetikon-Zuerich [u.a.] Trans Tech Publ. 2001 94, IV S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials science foundations 14 Literaturverz. S. 93 - [95] Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Tomlinson, Anthony A. G. Verfasser aut Materials science foundations 14 (DE-604)BV012703911 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015299695&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | DeStefanis, A. Tomlinson, Anthony A. G. Scanning probe microscopies from surface structure to nano-scale engineering Materials science foundations Rastersondenmikroskopie (DE-588)4330328-6 gnd |
subject_GND | (DE-588)4330328-6 |
title | Scanning probe microscopies from surface structure to nano-scale engineering |
title_auth | Scanning probe microscopies from surface structure to nano-scale engineering |
title_exact_search | Scanning probe microscopies from surface structure to nano-scale engineering |
title_exact_search_txtP | Scanning probe microscopies from surface structure to nano-scale engineering |
title_full | Scanning probe microscopies from surface structure to nano-scale engineering |
title_fullStr | Scanning probe microscopies from surface structure to nano-scale engineering |
title_full_unstemmed | Scanning probe microscopies from surface structure to nano-scale engineering |
title_short | Scanning probe microscopies |
title_sort | scanning probe microscopies from surface structure to nano scale engineering |
title_sub | from surface structure to nano-scale engineering |
topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
topic_facet | Rastersondenmikroskopie |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015299695&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
volume_link | (DE-604)BV012703911 |
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