... IEEE international reliability physics proceedings: ... annual 33 Las Vegas, Nevada, April 4,5,6, 1995
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Piscataway, NJ
Inst. of Electrical and Electronics Engineers
1995
|
| Subjects: | |
| Physical Description: | VII, 405 S. Ill., graph. Darst. |
| ISBN: | 078032031X 0780320328 0780320336 |
Staff View
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| isbn | 078032031X 0780320328 0780320336 |
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| physical | VII, 405 S. Ill., graph. Darst. |
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| spelling | Institute of Electrical and Electronics Engineers Verfasser (DE-588)1692-5 aut ... IEEE international reliability physics proceedings ... annual 33 Las Vegas, Nevada, April 4,5,6, 1995 Piscataway, NJ Inst. of Electrical and Electronics Engineers 1995 VII, 405 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021855413 33 |
| spellingShingle | ... IEEE international reliability physics proceedings ... annual Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ... IEEE international reliability physics proceedings ... annual |
| title_auth | ... IEEE international reliability physics proceedings ... annual |
| title_exact_search | ... IEEE international reliability physics proceedings ... annual |
| title_exact_search_txtP | ... IEEE international reliability physics proceedings ... annual |
| title_full | ... IEEE international reliability physics proceedings ... annual 33 Las Vegas, Nevada, April 4,5,6, 1995 |
| title_fullStr | ... IEEE international reliability physics proceedings ... annual 33 Las Vegas, Nevada, April 4,5,6, 1995 |
| title_full_unstemmed | ... IEEE international reliability physics proceedings ... annual 33 Las Vegas, Nevada, April 4,5,6, 1995 |
| title_short | ... IEEE international reliability physics proceedings |
| title_sort | ieee international reliability physics proceedings annual las vegas nevada april 4 5 6 1995 |
| title_sub | ... annual |
| topic | Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses |
| topic_facet | Fiabilité - Congrès Microélectronique - Fiabilité - Congrès Electronic apparatus and appliances Reliability Congresses Konferenzschrift |
| volume_link | (DE-604)BV021855413 |
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