... IEEE international reliability physics proceedings: ... annual 32 San Jose, California, April 12, 13, 14, 1994
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Piscataway, NJ
Inst. of Electrical and Electronics Engineers
1994
|
| Physical Description: | XI, 505 S. Ill., graph. Darst. |
| ISBN: | 0780313577 0780313585 0780313593 |
Staff View
MARC
| LEADER | 00000nam a2200000zcc4500 | ||
|---|---|---|---|
| 001 | BV022070418 | ||
| 003 | DE-604 | ||
| 005 | 20060314000000.0 | ||
| 007 | t | ||
| 008 | 960614s1994 ad|| |||| 10||| eng d | ||
| 020 | |a 0780313577 |9 0-7803-1357-7 | ||
| 020 | |a 0780313585 |9 0-7803-1358-5 | ||
| 020 | |a 0780313593 |9 0-7803-1359-3 | ||
| 035 | |a (OCoLC)633845004 | ||
| 035 | |a (DE-599)BVBBV022070418 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 110 | 2 | |a Institute of Electrical and Electronics Engineers |e Verfasser |0 (DE-588)1692-5 |4 aut | |
| 245 | 1 | 0 | |a ... IEEE international reliability physics proceedings |b ... annual |n 32 |p San Jose, California, April 12, 13, 14, 1994 |
| 264 | 1 | |a Piscataway, NJ |b Inst. of Electrical and Electronics Engineers |c 1994 | |
| 300 | |a XI, 505 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 773 | 0 | 8 | |w (DE-604)BV021855413 |g 32 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015285201 | ||
Record in the Search Index
| _version_ | 1804136046212939776 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | Institute of Electrical and Electronics Engineers |
| author_corporate_role | aut |
| author_facet | Institute of Electrical and Electronics Engineers |
| author_sort | Institute of Electrical and Electronics Engineers |
| building | Verbundindex |
| bvnumber | BV022070418 |
| ctrlnum | (OCoLC)633845004 (DE-599)BVBBV022070418 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00981nam a2200289zcc4500</leader><controlfield tag="001">BV022070418</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060314000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">960614s1994 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780313577</subfield><subfield code="9">0-7803-1357-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780313585</subfield><subfield code="9">0-7803-1358-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780313593</subfield><subfield code="9">0-7803-1359-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633845004</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022070418</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">... IEEE international reliability physics proceedings</subfield><subfield code="b">... annual</subfield><subfield code="n">32</subfield><subfield code="p">San Jose, California, April 12, 13, 14, 1994</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 505 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021855413</subfield><subfield code="g">32</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015285201</subfield></datafield></record></collection> |
| id | DE-604.BV022070418 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:13:52Z |
| indexdate | 2024-07-09T20:50:10Z |
| institution | BVB |
| institution_GND | (DE-588)1692-5 |
| isbn | 0780313577 0780313585 0780313593 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015285201 |
| oclc_num | 633845004 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XI, 505 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | Institute of Electrical and Electronics Engineers Verfasser (DE-588)1692-5 aut ... IEEE international reliability physics proceedings ... annual 32 San Jose, California, April 12, 13, 14, 1994 Piscataway, NJ Inst. of Electrical and Electronics Engineers 1994 XI, 505 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-604)BV021855413 32 |
| spellingShingle | ... IEEE international reliability physics proceedings ... annual |
| title | ... IEEE international reliability physics proceedings ... annual |
| title_auth | ... IEEE international reliability physics proceedings ... annual |
| title_exact_search | ... IEEE international reliability physics proceedings ... annual |
| title_exact_search_txtP | ... IEEE international reliability physics proceedings ... annual |
| title_full | ... IEEE international reliability physics proceedings ... annual 32 San Jose, California, April 12, 13, 14, 1994 |
| title_fullStr | ... IEEE international reliability physics proceedings ... annual 32 San Jose, California, April 12, 13, 14, 1994 |
| title_full_unstemmed | ... IEEE international reliability physics proceedings ... annual 32 San Jose, California, April 12, 13, 14, 1994 |
| title_short | ... IEEE international reliability physics proceedings |
| title_sort | ieee international reliability physics proceedings annual san jose california april 12 13 14 1994 |
| title_sub | ... annual |
| volume_link | (DE-604)BV021855413 |
| work_keys_str_mv | AT instituteofelectricalandelectronicsengineers ieeeinternationalreliabilityphysicsproceedingsannual32 |