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Chicago-Zitierstil (17. Ausg.)International Conference on Microelectronic Test Structures. Proceedings of the ... International Conference on Microelectronic Test Structures. New York, NY: IEEE, 1995.
MLA-Zitierstil (9. Ausg.)International Conference on Microelectronic Test Structures. Proceedings of the ... International Conference on Microelectronic Test Structures. IEEE, 1995.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.