Proceedings of the ... International Conference on Microelectronic Test Structures: 1995 March 22 - 25, 1995, Nara, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
IEEE
1995
|
| Schlagworte: | |
| Beschreibung: | XII, 304 S. Ill., graph. Darst. |
| ISBN: | 0780320654 0780320662 0780320670 |
Internformat
MARC
| LEADER | 00000nam a2200000zcc4500 | ||
|---|---|---|---|
| 001 | BV022053462 | ||
| 003 | DE-604 | ||
| 005 | 20060314000000.0 | ||
| 007 | t | ||
| 008 | 960614s1995 ad|| |||| 10||| eng d | ||
| 020 | |a 0780320654 |9 0-7803-2065-4 | ||
| 020 | |a 0780320662 |9 0-7803-2066-2 | ||
| 020 | |a 0780320670 |9 0-7803-2067-0 | ||
| 035 | |a (OCoLC)32830039 | ||
| 035 | |a (DE-599)BVBBV022053462 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a TK7874 | |
| 111 | 2 | |a International Conference on Microelectronic Test Structures |j Verfasser |0 (DE-588)5014669-5 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the ... International Conference on Microelectronic Test Structures |n 1995 |p March 22 - 25, 1995, Nara, Japan |
| 264 | 1 | |a New York, NY |b IEEE |c 1995 | |
| 300 | |a XII, 304 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Microélectronique - Essais - Congrès |2 ram | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 773 | 0 | 8 | |w (DE-604)BV021851880 |g 1995 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015268194 | ||
Datensatz im Suchindex
| _version_ | 1804136028709060608 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Conference on Microelectronic Test Structures |
| author_corporate_role | aut |
| author_facet | International Conference on Microelectronic Test Structures |
| author_sort | International Conference on Microelectronic Test Structures |
| building | Verbundindex |
| bvnumber | BV022053462 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)32830039 (DE-599)BVBBV022053462 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01165nam a2200337zcc4500</leader><controlfield tag="001">BV022053462</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060314000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">960614s1995 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780320654</subfield><subfield code="9">0-7803-2065-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780320662</subfield><subfield code="9">0-7803-2066-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780320670</subfield><subfield code="9">0-7803-2067-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)32830039</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022053462</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Microelectronic Test Structures</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5014669-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the ... International Conference on Microelectronic Test Structures</subfield><subfield code="n">1995</subfield><subfield code="p">March 22 - 25, 1995, Nara, Japan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">IEEE</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 304 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microélectronique - Essais - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021851880</subfield><subfield code="g">1995</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015268194</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022053462 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:13:21Z |
| indexdate | 2024-07-09T20:49:53Z |
| institution | BVB |
| institution_GND | (DE-588)5014669-5 |
| isbn | 0780320654 0780320662 0780320670 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015268194 |
| oclc_num | 32830039 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XII, 304 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | IEEE |
| record_format | marc |
| spelling | International Conference on Microelectronic Test Structures Verfasser (DE-588)5014669-5 aut Proceedings of the ... International Conference on Microelectronic Test Structures 1995 March 22 - 25, 1995, Nara, Japan New York, NY IEEE 1995 XII, 304 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microélectronique - Essais - Congrès ram Integrated circuits Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021851880 1995 |
| spellingShingle | Proceedings of the ... International Conference on Microelectronic Test Structures Microélectronique - Essais - Congrès ram Integrated circuits Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_auth | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search_txtP | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_full | Proceedings of the ... International Conference on Microelectronic Test Structures 1995 March 22 - 25, 1995, Nara, Japan |
| title_fullStr | Proceedings of the ... International Conference on Microelectronic Test Structures 1995 March 22 - 25, 1995, Nara, Japan |
| title_full_unstemmed | Proceedings of the ... International Conference on Microelectronic Test Structures 1995 March 22 - 25, 1995, Nara, Japan |
| title_short | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the international conference on microelectronic test structures march 22 25 1995 nara japan |
| topic | Microélectronique - Essais - Congrès ram Integrated circuits Testing Congresses |
| topic_facet | Microélectronique - Essais - Congrès Integrated circuits Testing Congresses Konferenzschrift |
| volume_link | (DE-604)BV021851880 |
| work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructures proceedingsoftheinternationalconferenceonmicroelectronicteststructures1995 |