Proceedings of the ... International Conference on Microelectronic Test Structures: 1992 March 16-19, 1992, San Diego, Calif
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
IEEE
1991
|
| Beschreibung: | XI, 213 S. Ill., graph. Darst. |
| ISBN: | 0780305353 0780305361 078030537X |
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| spelling | International Conference on Microelectronic Test Structures Verfasser (DE-588)5014669-5 aut Proceedings of the ... International Conference on Microelectronic Test Structures 1992 March 16-19, 1992, San Diego, Calif New York, NY IEEE 1991 XI, 213 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-604)BV021851880 1992 |
| spellingShingle | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_auth | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search_txtP | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_full | Proceedings of the ... International Conference on Microelectronic Test Structures 1992 March 16-19, 1992, San Diego, Calif |
| title_fullStr | Proceedings of the ... International Conference on Microelectronic Test Structures 1992 March 16-19, 1992, San Diego, Calif |
| title_full_unstemmed | Proceedings of the ... International Conference on Microelectronic Test Structures 1992 March 16-19, 1992, San Diego, Calif |
| title_short | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the international conference on microelectronic test structures march 16 19 1992 san diego calif |
| volume_link | (DE-604)BV021851880 |
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