Proceedings of the ... International Conference on Microelectronic Test Structures: 1991 March 18 - 20, 1991, Kyoto, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
IEEE
1991
|
| Schlagworte: | |
| Beschreibung: | XII, 264 S. Ill., graph. Darst. |
| ISBN: | 0879425881 087942589X 0879425903 |
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| isbn | 0879425881 087942589X 0879425903 |
| language | English |
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| physical | XII, 264 S. Ill., graph. Darst. |
| publishDate | 1991 |
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| spelling | International Conference on Microelectronic Test Structures Verfasser (DE-588)5014669-5 aut Proceedings of the ... International Conference on Microelectronic Test Structures 1991 March 18 - 20, 1991, Kyoto, Japan New York, NY IEEE 1991 XII, 264 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021851880 1991 |
| spellingShingle | Proceedings of the ... International Conference on Microelectronic Test Structures Integrated circuits Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_auth | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_exact_search_txtP | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_full | Proceedings of the ... International Conference on Microelectronic Test Structures 1991 March 18 - 20, 1991, Kyoto, Japan |
| title_fullStr | Proceedings of the ... International Conference on Microelectronic Test Structures 1991 March 18 - 20, 1991, Kyoto, Japan |
| title_full_unstemmed | Proceedings of the ... International Conference on Microelectronic Test Structures 1991 March 18 - 20, 1991, Kyoto, Japan |
| title_short | Proceedings of the ... International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the international conference on microelectronic test structures march 18 20 1991 kyoto japan |
| topic | Integrated circuits Testing Congresses |
| topic_facet | Integrated circuits Testing Congresses Konferenzschrift |
| volume_link | (DE-604)BV021851880 |
| work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructures proceedingsoftheinternationalconferenceonmicroelectronicteststructures1991 |