Digest of papers: 15 June 19-21, 1985
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
IEEE
1985
|
Schlagworte: | |
Beschreibung: | XVII, 445 S. graph. Darst. |
ISBN: | 0818686189 0818660155 0818646187 |
Internformat
MARC
LEADER | 00000nam a2200000zcc4500 | ||
---|---|---|---|
001 | BV022030803 | ||
003 | DE-604 | ||
005 | 20060314000000.0 | ||
007 | t | ||
008 | 960614s1985 d||| |||| 10||| eng d | ||
020 | |a 0818686189 |9 0-8186-8618-9 | ||
020 | |a 0818660155 |9 0-8186-6015-5 | ||
020 | |a 0818646187 |9 0-8186-4618-7 | ||
035 | |a (OCoLC)12231608 | ||
035 | |a (DE-599)BVBBV022030803 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
050 | 0 | |a QA76.9.F38 | |
082 | 0 | |a 004.2 | |
111 | 2 | |a International Symposium on Fault Tolerant Computing |j Verfasser |0 (DE-588)12881-8 |4 aut | |
245 | 1 | 0 | |a Digest of papers |n 15 |p June 19-21, 1985 |c ... Annual International Symposium on Fault-Tolerant Computing, FTCS ... |
264 | 1 | |a New York, NY |b IEEE |c 1985 | |
300 | |a XVII, 445 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 7 | |a Ordinateurs - Fiabilité - Congrès |2 ram | |
650 | 7 | |a Programmation - Congrès |2 ram | |
650 | 7 | |a Systèmes, Conception de - Congrès |2 ram | |
650 | 7 | |a Tolérance aux fautes (informatique) - Congrès |2 ram | |
650 | 7 | |a autotest |2 inriac | |
650 | 7 | |a compression donnée |2 inriac | |
650 | 7 | |a diagnostic erreur |2 inriac | |
650 | 7 | |a fiabilité système |2 inriac | |
650 | 7 | |a modélisation erreur |2 inriac | |
650 | 7 | |a programmation parallèle |2 inriac | |
650 | 7 | |a robustesse |2 inriac | |
650 | 7 | |a synchronisation système réparti |2 inriac | |
650 | 7 | |a système réparti |2 inriac | |
650 | 7 | |a test protocole |2 inriac | |
650 | 7 | |a tolérance panne |2 inriac | |
650 | 7 | |a évaluation |2 inriac | |
650 | 4 | |a Electronic digital computers |v Congresses | |
650 | 4 | |a Fault-tolerant computing |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
773 | 0 | 8 | |w (DE-604)BV021847779 |g 15 |
999 | |a oai:aleph.bib-bvb.de:BVB01-015245456 |
Datensatz im Suchindex
_version_ | 1804136004917919744 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author_corporate | International Symposium on Fault Tolerant Computing |
author_corporate_role | aut |
author_facet | International Symposium on Fault Tolerant Computing |
author_sort | International Symposium on Fault Tolerant Computing |
building | Verbundindex |
bvnumber | BV022030803 |
callnumber-first | Q - Science |
callnumber-label | QA76 |
callnumber-raw | QA76.9.F38 |
callnumber-search | QA76.9.F38 |
callnumber-sort | QA 276.9 F38 |
callnumber-subject | QA - Mathematics |
ctrlnum | (OCoLC)12231608 (DE-599)BVBBV022030803 |
dewey-full | 004.2 |
dewey-hundreds | 000 - Computer science, information, general works |
dewey-ones | 004 - Computer science |
dewey-raw | 004.2 |
dewey-search | 004.2 |
dewey-sort | 14.2 |
dewey-tens | 000 - Computer science, information, general works |
discipline | Informatik |
discipline_str_mv | Informatik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01894nam a2200541zcc4500</leader><controlfield tag="001">BV022030803</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060314000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">960614s1985 d||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818686189</subfield><subfield code="9">0-8186-8618-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818660155</subfield><subfield code="9">0-8186-6015-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818646187</subfield><subfield code="9">0-8186-4618-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)12231608</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022030803</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QA76.9.F38</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.2</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium on Fault Tolerant Computing</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)12881-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Digest of papers</subfield><subfield code="n">15</subfield><subfield code="p">June 19-21, 1985</subfield><subfield code="c">... Annual International Symposium on Fault-Tolerant Computing, FTCS ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">IEEE</subfield><subfield code="c">1985</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 445 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Ordinateurs - Fiabilité - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Programmation - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Systèmes, Conception de - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Tolérance aux fautes (informatique) - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">autotest</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">compression donnée</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">diagnostic erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">fiabilité système</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">modélisation erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">programmation parallèle</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">robustesse</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">synchronisation système réparti</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">système réparti</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test protocole</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">tolérance panne</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">évaluation</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021847779</subfield><subfield code="g">15</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015245456</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV022030803 |
illustrated | Illustrated |
index_date | 2024-07-02T16:12:36Z |
indexdate | 2024-07-09T20:49:31Z |
institution | BVB |
institution_GND | (DE-588)12881-8 |
isbn | 0818686189 0818660155 0818646187 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015245456 |
oclc_num | 12231608 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | XVII, 445 S. graph. Darst. |
publishDate | 1985 |
publishDateSearch | 1985 |
publishDateSort | 1985 |
publisher | IEEE |
record_format | marc |
spelling | International Symposium on Fault Tolerant Computing Verfasser (DE-588)12881-8 aut Digest of papers 15 June 19-21, 1985 ... Annual International Symposium on Fault-Tolerant Computing, FTCS ... New York, NY IEEE 1985 XVII, 445 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ordinateurs - Fiabilité - Congrès ram Programmation - Congrès ram Systèmes, Conception de - Congrès ram Tolérance aux fautes (informatique) - Congrès ram autotest inriac compression donnée inriac diagnostic erreur inriac fiabilité système inriac modélisation erreur inriac programmation parallèle inriac robustesse inriac synchronisation système réparti inriac système réparti inriac test protocole inriac tolérance panne inriac évaluation inriac Electronic digital computers Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021847779 15 |
spellingShingle | Digest of papers Ordinateurs - Fiabilité - Congrès ram Programmation - Congrès ram Systèmes, Conception de - Congrès ram Tolérance aux fautes (informatique) - Congrès ram autotest inriac compression donnée inriac diagnostic erreur inriac fiabilité système inriac modélisation erreur inriac programmation parallèle inriac robustesse inriac synchronisation système réparti inriac système réparti inriac test protocole inriac tolérance panne inriac évaluation inriac Electronic digital computers Congresses Fault-tolerant computing Congresses |
subject_GND | (DE-588)1071861417 |
title | Digest of papers |
title_auth | Digest of papers |
title_exact_search | Digest of papers |
title_exact_search_txtP | Digest of papers |
title_full | Digest of papers 15 June 19-21, 1985 ... Annual International Symposium on Fault-Tolerant Computing, FTCS ... |
title_fullStr | Digest of papers 15 June 19-21, 1985 ... Annual International Symposium on Fault-Tolerant Computing, FTCS ... |
title_full_unstemmed | Digest of papers 15 June 19-21, 1985 ... Annual International Symposium on Fault-Tolerant Computing, FTCS ... |
title_short | Digest of papers |
title_sort | digest of papers june 19 21 1985 |
topic | Ordinateurs - Fiabilité - Congrès ram Programmation - Congrès ram Systèmes, Conception de - Congrès ram Tolérance aux fautes (informatique) - Congrès ram autotest inriac compression donnée inriac diagnostic erreur inriac fiabilité système inriac modélisation erreur inriac programmation parallèle inriac robustesse inriac synchronisation système réparti inriac système réparti inriac test protocole inriac tolérance panne inriac évaluation inriac Electronic digital computers Congresses Fault-tolerant computing Congresses |
topic_facet | Ordinateurs - Fiabilité - Congrès Programmation - Congrès Systèmes, Conception de - Congrès Tolérance aux fautes (informatique) - Congrès autotest compression donnée diagnostic erreur fiabilité système modélisation erreur programmation parallèle robustesse synchronisation système réparti système réparti test protocole tolérance panne évaluation Electronic digital computers Congresses Fault-tolerant computing Congresses Konferenzschrift |
volume_link | (DE-604)BV021847779 |
work_keys_str_mv | AT internationalsymposiumonfaulttolerantcomputing digestofpapers15 |