Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology:
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
Brookfield, VT [u.a.]
Sci-Tech Publ.
1989
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Schriftenreihe: | Diffusion and defect data
Pt. B, Solid state phenomena ; 6/7 |
Schlagworte: | |
Beschreibung: | IX, 607 S. Ill., graph. Darst. |
ISBN: | 3908044049 |
Internformat
MARC
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245 | 1 | 0 | |a Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |c GADEST '89. Ed. by M. Kittler |
246 | 1 | 3 | |a Gettering and defect engineering in the semiconductor technology |
264 | 1 | |a Brookfield, VT [u.a.] |b Sci-Tech Publ. |c 1989 | |
300 | |a IX, 607 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Diffusion and defect data : Pt. B, Solid state phenomena |v 6/7 | |
650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
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700 | 1 | |a Kittler, Martin |e Sonstige |4 oth | |
830 | 0 | |a Diffusion and defect data |v Pt. B, Solid state phenomena ; 6/7 |w (DE-604)BV021637351 |9 6/7 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015244011 |
Datensatz im Suchindex
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any_adam_object | |
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author_corporate | GADEST Garzau |
author_corporate_role | aut |
author_facet | GADEST Garzau |
author_sort | GADEST Garzau |
building | Verbundindex |
bvnumber | BV022029363 |
classification_rvk | UP 3250 |
classification_tum | PHY 696f |
ctrlnum | (OCoLC)635317528 (DE-599)BVBBV022029363 |
discipline | Physik |
discipline_str_mv | Physik |
format | Conference Proceeding Book |
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genre | (DE-588)1071861417 Konferenzschrift 1989 Garzau gnd-content |
genre_facet | Konferenzschrift 1989 Garzau |
id | DE-604.BV022029363 |
illustrated | Illustrated |
index_date | 2024-07-02T16:12:32Z |
indexdate | 2024-07-09T20:49:29Z |
institution | BVB |
institution_GND | (DE-588)5043024-5 |
isbn | 3908044049 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015244011 |
oclc_num | 635317528 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | IX, 607 S. Ill., graph. Darst. |
publishDate | 1989 |
publishDateSearch | 1989 |
publishDateSort | 1989 |
publisher | Sci-Tech Publ. |
record_format | marc |
series | Diffusion and defect data |
series2 | Diffusion and defect data : Pt. B, Solid state phenomena |
spelling | GADEST 3 1989 Garzau Verfasser (DE-588)5043024-5 aut Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology GADEST '89. Ed. by M. Kittler Gettering and defect engineering in the semiconductor technology Brookfield, VT [u.a.] Sci-Tech Publ. 1989 IX, 607 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Diffusion and defect data : Pt. B, Solid state phenomena 6/7 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Halbleiterphysik (DE-588)4113829-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1989 Garzau gnd-content Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Halbleiterphysik (DE-588)4113829-6 s VLSI (DE-588)4117388-0 s Kittler, Martin Sonstige oth Diffusion and defect data Pt. B, Solid state phenomena ; 6/7 (DE-604)BV021637351 6/7 |
spellingShingle | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology Diffusion and defect data Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd VLSI (DE-588)4117388-0 gnd Halbleiterphysik (DE-588)4113829-6 gnd |
subject_GND | (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)4117388-0 (DE-588)4113829-6 (DE-588)1071861417 |
title | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |
title_alt | Gettering and defect engineering in the semiconductor technology |
title_auth | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |
title_exact_search | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |
title_exact_search_txtP | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |
title_full | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology GADEST '89. Ed. by M. Kittler |
title_fullStr | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology GADEST '89. Ed. by M. Kittler |
title_full_unstemmed | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology GADEST '89. Ed. by M. Kittler |
title_short | Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology |
title_sort | proceedings of the 3 international autumn meeting gettering and defect engineering in the semiconductor technology |
topic | Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd VLSI (DE-588)4117388-0 gnd Halbleiterphysik (DE-588)4113829-6 gnd |
topic_facet | Gitterbaufehler Halbleiter VLSI Halbleiterphysik Konferenzschrift 1989 Garzau |
volume_link | (DE-604)BV021637351 |
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