Proceedings: 2001 [ Theme: Applications & trends for using reliability & maintainability tools ] : Philadelphia, Pennsylvania, USA, 2001, January 22 - 25
Saved in:
Bibliographic Details
Corporate Author: Reliability and Maintainability Symposium (Author)
Format: Conference Proceeding Book
Language:English
Published: New York Inst. of Electrical and Electronics Engineers 2001
Item Description:Literaturangaben
Physical Description:XX, 436 S. Ill., graph. Darst.
ISBN:0780366158
0780366166

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!