Secondary ion mass spectrometry: 5 Washington, DC, Sept. 30 - Oct. 4, 1985
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
|
| Schriftenreihe: | Springer series in chemical physics
... |
| Beschreibung: | XXI, 561 S. Ill |
| ISBN: | 3540162631 0387162631 |
Internformat
MARC
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Datensatz im Suchindex
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| illustrated | Illustrated |
| index_date | 2024-07-02T16:12:30Z |
| indexdate | 2024-07-09T20:49:27Z |
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| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry 5 Washington, DC, Sept. 30 - Oct. 4, 1985 ed.: A. Benninghoven ... Berlin [u.a.] Springer XXI, 561 S. Ill txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 44 Springer series in chemical physics ... Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth (DE-604)BV022124762 5 Springer series in chemical physics ... (DE-604)BV000000670 |
| spellingShingle | Secondary ion mass spectrometry Springer series in chemical physics |
| title | Secondary ion mass spectrometry |
| title_auth | Secondary ion mass spectrometry |
| title_exact_search | Secondary ion mass spectrometry |
| title_exact_search_txtP | Secondary ion mass spectrometry |
| title_full | Secondary ion mass spectrometry 5 Washington, DC, Sept. 30 - Oct. 4, 1985 ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry 5 Washington, DC, Sept. 30 - Oct. 4, 1985 ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry 5 Washington, DC, Sept. 30 - Oct. 4, 1985 ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry washington dc sept 30 oct 4 1985 |
| volume_link | (DE-604)BV022124762 (DE-604)BV000000670 |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometry5 AT sims secondaryionmassspectrometry5 |