Secondary ion mass spectrometry: 2 Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1979
|
| Schriftenreihe: | Springer series in chemical physics
... |
| Beschreibung: | XIII, 298 S. Ill |
| ISBN: | 3540098437 0387098437 |
Internformat
MARC
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Datensatz im Suchindex
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| index_date | 2024-07-02T16:12:30Z |
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| isbn | 3540098437 0387098437 |
| language | English |
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| physical | XIII, 298 S. Ill |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | Springer |
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| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry 2 Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 ed.: A. Benninghoven ... Berlin [u.a.] Springer 1979 XIII, 298 S. Ill txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 9 Springer series in chemical physics ... Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth (DE-604)BV022124762 2 Springer series in chemical physics ... (DE-604)BV000000670 |
| spellingShingle | Secondary ion mass spectrometry Springer series in chemical physics |
| title | Secondary ion mass spectrometry |
| title_auth | Secondary ion mass spectrometry |
| title_exact_search | Secondary ion mass spectrometry |
| title_exact_search_txtP | Secondary ion mass spectrometry |
| title_full | Secondary ion mass spectrometry 2 Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry 2 Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry 2 Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry stanford univ stanford calif usa aug 27 31 1979 |
| volume_link | (DE-604)BV022124762 (DE-604)BV000000670 |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometry2 AT sims secondaryionmassspectrometry2 |