Proceedings: 2002
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Silver Spring, Md.
IEEE Computer Soc. Pr.
2002
|
Beschreibung: | Literaturangaben |
Beschreibung: | XVI, 1250 S. Ill., graph. Darst. |
ISBN: | 0780375424 |
Internformat
MARC
LEADER | 00000nam a2200000zcc4500 | ||
---|---|---|---|
001 | BV022023498 | ||
003 | DE-604 | ||
005 | 20030227000000.0 | ||
007 | t | ||
008 | 030204s2002 ad|| |||| 10||| eng d | ||
020 | |a 0780375424 |9 0-7803-7542-4 | ||
035 | |a (OCoLC)756352900 | ||
035 | |a (DE-599)BVBBV022023498 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
111 | 2 | |a International Test Conference |j Verfasser |0 (DE-588)212658-8 |4 aut | |
245 | 1 | 0 | |a Proceedings |n 2002 |c International Test Conference |
264 | 1 | |a Silver Spring, Md. |b IEEE Computer Soc. Pr. |c 2002 | |
300 | |a XVI, 1250 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturangaben | ||
773 | 0 | 8 | |w (DE-604)BV021846582 |g 2002 |
999 | |a oai:aleph.bib-bvb.de:BVB01-015238138 |
Datensatz im Suchindex
_version_ | 1804135997265412096 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author_corporate | International Test Conference |
author_corporate_role | aut |
author_facet | International Test Conference |
author_sort | International Test Conference |
building | Verbundindex |
bvnumber | BV022023498 |
ctrlnum | (OCoLC)756352900 (DE-599)BVBBV022023498 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00829nam a2200277zcc4500</leader><controlfield tag="001">BV022023498</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20030227000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">030204s2002 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780375424</subfield><subfield code="9">0-7803-7542-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)756352900</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022023498</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)212658-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="n">2002</subfield><subfield code="c">International Test Conference</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Silver Spring, Md.</subfield><subfield code="b">IEEE Computer Soc. Pr.</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 1250 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021846582</subfield><subfield code="g">2002</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015238138</subfield></datafield></record></collection> |
id | DE-604.BV022023498 |
illustrated | Illustrated |
index_date | 2024-07-02T16:12:22Z |
indexdate | 2024-07-09T20:49:23Z |
institution | BVB |
institution_GND | (DE-588)212658-8 |
isbn | 0780375424 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015238138 |
oclc_num | 756352900 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | XVI, 1250 S. Ill., graph. Darst. |
publishDate | 2002 |
publishDateSearch | 2002 |
publishDateSort | 2002 |
publisher | IEEE Computer Soc. Pr. |
record_format | marc |
spelling | International Test Conference Verfasser (DE-588)212658-8 aut Proceedings 2002 International Test Conference Silver Spring, Md. IEEE Computer Soc. Pr. 2002 XVI, 1250 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben (DE-604)BV021846582 2002 |
spellingShingle | Proceedings |
title | Proceedings |
title_auth | Proceedings |
title_exact_search | Proceedings |
title_exact_search_txtP | Proceedings |
title_full | Proceedings 2002 International Test Conference |
title_fullStr | Proceedings 2002 International Test Conference |
title_full_unstemmed | Proceedings 2002 International Test Conference |
title_short | Proceedings |
title_sort | proceedings |
volume_link | (DE-604)BV021846582 |
work_keys_str_mv | AT internationaltestconference proceedings2002 |