Proceedings: 1996
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Silver Spring, Md.
IEEE Computer Soc. Pr.
1996
|
| Schlagworte: | |
| Beschreibung: | XII, 951 S. graph. Darst. |
| ISBN: | 0780335406 0780335414 0780335422 0780335430 |
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Datensatz im Suchindex
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| id | DE-604.BV022023492 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:12:22Z |
| indexdate | 2024-07-09T20:49:23Z |
| institution | BVB |
| institution_GND | (DE-588)212658-8 |
| isbn | 0780335406 0780335414 0780335422 0780335430 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015238132 |
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| physical | XII, 951 S. graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | IEEE Computer Soc. Pr. |
| record_format | marc |
| spelling | International Test Conference Verfasser (DE-588)212658-8 aut Proceedings 1996 International Test Conference Silver Spring, Md. IEEE Computer Soc. Pr. 1996 XII, 951 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier BIST inriac Circuits intégrés - Essais - Congrès ram DFT inriac architecture test inriac simulation panne inriac test automatique inriac test circuit inriac test microprocesseur inriac test mémoire inriac test système inriac Electronic digital computers Circuits Testing Congresses Integrated circuits Fault tolerance Congresses Integrated circuits Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021846582 1996 |
| spellingShingle | Proceedings BIST inriac Circuits intégrés - Essais - Congrès ram DFT inriac architecture test inriac simulation panne inriac test automatique inriac test circuit inriac test microprocesseur inriac test mémoire inriac test système inriac Electronic digital computers Circuits Testing Congresses Integrated circuits Fault tolerance Congresses Integrated circuits Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings |
| title_auth | Proceedings |
| title_exact_search | Proceedings |
| title_exact_search_txtP | Proceedings |
| title_full | Proceedings 1996 International Test Conference |
| title_fullStr | Proceedings 1996 International Test Conference |
| title_full_unstemmed | Proceedings 1996 International Test Conference |
| title_short | Proceedings |
| title_sort | proceedings |
| topic | BIST inriac Circuits intégrés - Essais - Congrès ram DFT inriac architecture test inriac simulation panne inriac test automatique inriac test circuit inriac test microprocesseur inriac test mémoire inriac test système inriac Electronic digital computers Circuits Testing Congresses Integrated circuits Fault tolerance Congresses Integrated circuits Testing Congresses |
| topic_facet | BIST Circuits intégrés - Essais - Congrès DFT architecture test simulation panne test automatique test circuit test microprocesseur test mémoire test système Electronic digital computers Circuits Testing Congresses Integrated circuits Fault tolerance Congresses Integrated circuits Testing Congresses Konferenzschrift |
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