Proceedings: 1985 The future of test : Nov. 19, 20, 21, 1985
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Silver Spring, Md.
IEEE Computer Soc. Pr.
1985
|
| Beschreibung: | getr. Seitenzählg. |
| ISBN: | 081860641X |
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| isbn | 081860641X |
| language | English |
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| publishDate | 1985 |
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| spelling | International Test Conference Verfasser (DE-588)212658-8 aut Proceedings 1985 The future of test : Nov. 19, 20, 21, 1985 International Test Conference Silver Spring, Md. IEEE Computer Soc. Pr. 1985 getr. Seitenzählg. txt rdacontent n rdamedia nc rdacarrier (DE-604)BV021846582 1985 |
| spellingShingle | Proceedings |
| title | Proceedings |
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| title_full | Proceedings 1985 The future of test : Nov. 19, 20, 21, 1985 International Test Conference |
| title_fullStr | Proceedings 1985 The future of test : Nov. 19, 20, 21, 1985 International Test Conference |
| title_full_unstemmed | Proceedings 1985 The future of test : Nov. 19, 20, 21, 1985 International Test Conference |
| title_short | Proceedings |
| title_sort | proceedings the future of test nov 19 20 21 1985 |
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