Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | English |
| Veröffentlicht: |
1977
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| Ausgabe: | [Mikrofiche-Ausg.] |
| Beschreibung: | New York, NY, Univ., Diss., 1977. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 2 Mikrofiches |
| Beschreibung: | XII, 100 S. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021998713 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | he|uuuuuuuucu | ||
| 008 | 061110s1977 d||| b|||| 00||| eng d | ||
| 035 | |a (OCoLC)634860513 | ||
| 035 | |a (DE-599)BVBBV021998713 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 100 | 1 | |a Sarris, Achilles Aristotle |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |c Achilles Aristotle Sarris |
| 250 | |a [Mikrofiche-Ausg.] | ||
| 264 | 1 | |c 1977 | |
| 300 | |a XII, 100 S. |b graph. Darst. | ||
| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a New York, NY, Univ., Diss., 1977. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 2 Mikrofiches | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015213330 | ||
Datensatz im Suchindex
| _version_ | 1804135973760532480 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Sarris, Achilles Aristotle |
| author_facet | Sarris, Achilles Aristotle |
| author_role | aut |
| author_sort | Sarris, Achilles Aristotle |
| author_variant | a a s aa aas |
| building | Verbundindex |
| bvnumber | BV021998713 |
| ctrlnum | (OCoLC)634860513 (DE-599)BVBBV021998713 |
| edition | [Mikrofiche-Ausg.] |
| format | Microfilm Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00862nam a2200253zc 4500</leader><controlfield tag="001">BV021998713</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">he|uuuuuuuucu</controlfield><controlfield tag="008">061110s1977 d||| b|||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634860513</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021998713</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sarris, Achilles Aristotle</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits</subfield><subfield code="c">Achilles Aristotle Sarris</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">[Mikrofiche-Ausg.]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1977</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 100 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">h</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">he</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">New York, NY, Univ., Diss., 1977. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 2 Mikrofiches</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015213330</subfield></datafield></record></collection> |
| id | DE-604.BV021998713 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:11:15Z |
| indexdate | 2024-07-09T20:49:01Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015213330 |
| oclc_num | 634860513 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XII, 100 S. graph. Darst. |
| publishDate | 1977 |
| publishDateSearch | 1977 |
| publishDateSort | 1977 |
| record_format | marc |
| spelling | Sarris, Achilles Aristotle Verfasser aut Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits Achilles Aristotle Sarris [Mikrofiche-Ausg.] 1977 XII, 100 S. graph. Darst. h rdamedia he rdacarrier New York, NY, Univ., Diss., 1977. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 2 Mikrofiches |
| spellingShingle | Sarris, Achilles Aristotle Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title_auth | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title_exact_search | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title_exact_search_txtP | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title_full | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits Achilles Aristotle Sarris |
| title_fullStr | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits Achilles Aristotle Sarris |
| title_full_unstemmed | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits Achilles Aristotle Sarris |
| title_short | Dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| title_sort | dynamic fault test generation and evaluation for combinational and asynchronous sequential circuits |
| work_keys_str_mv | AT sarrisachillesaristotle dynamicfaulttestgenerationandevaluationforcombinationalandasynchronoussequentialcircuits |