Defect and fault tolerance in VLSI systems:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
North-Holland
2002
|
Schlagworte: | |
Beschreibung: | Literaturangaben. - In: Journal of systems architecture ; 47 (2002),10 : Special issue |
Beschreibung: | S. 821 - 916 Ill., graph. Darst. |
Internformat
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illustrated | Illustrated |
index_date | 2024-07-02T16:09:06Z |
indexdate | 2024-07-09T20:48:27Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015183792 |
oclc_num | 634046214 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | S. 821 - 916 Ill., graph. Darst. |
publishDate | 2002 |
publishDateSearch | 2002 |
publishDateSort | 2002 |
publisher | North-Holland |
record_format | marc |
spelling | Defect and fault tolerance in VLSI systems guest ed.: E. Fujiwara ... Amsterdam [u.a.] North-Holland 2002 S. 821 - 916 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Journal of systems architecture ; 47 (2002),10 : Special issue Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 s DE-604 Fujiwara, Eiji Sonstige oth |
spellingShingle | Defect and fault tolerance in VLSI systems Fehlertoleranz (DE-588)4123192-2 gnd |
subject_GND | (DE-588)4123192-2 |
title | Defect and fault tolerance in VLSI systems |
title_auth | Defect and fault tolerance in VLSI systems |
title_exact_search | Defect and fault tolerance in VLSI systems |
title_exact_search_txtP | Defect and fault tolerance in VLSI systems |
title_full | Defect and fault tolerance in VLSI systems guest ed.: E. Fujiwara ... |
title_fullStr | Defect and fault tolerance in VLSI systems guest ed.: E. Fujiwara ... |
title_full_unstemmed | Defect and fault tolerance in VLSI systems guest ed.: E. Fujiwara ... |
title_short | Defect and fault tolerance in VLSI systems |
title_sort | defect and fault tolerance in vlsi systems |
topic | Fehlertoleranz (DE-588)4123192-2 gnd |
topic_facet | Fehlertoleranz |
work_keys_str_mv | AT fujiwaraeiji defectandfaulttoleranceinvlsisystems |