Symposium Advanced Characterisation of Semiconductor Materials Straßburg. (2001). Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials: May 30 - June 2, 2000, Strasbourg, France. Pergamon.
Chicago-Zitierstil (17. Ausg.)Symposium Advanced Characterisation of Semiconductor Materials Straßburg. Papers Presented at the EMRS 2000 Spring Meeting, Symposium M: Advanced Characterisation of Semiconductor Materials: May 30 - June 2, 2000, Strasbourg, France. Oxford [u.a.]: Pergamon, 2001.
MLA-Zitierstil (9. Ausg.)Symposium Advanced Characterisation of Semiconductor Materials Straßburg. Papers Presented at the EMRS 2000 Spring Meeting, Symposium M: Advanced Characterisation of Semiconductor Materials: May 30 - June 2, 2000, Strasbourg, France. Pergamon, 2001.