Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials: May 30 - June 2, 2000, Strasbourg, France
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Pergamon
2001
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| Schlagworte: | |
| Beschreibung: | Literaturangaben. - In: Materials science in semiconductor processing ; 4 (2001),1/3 : Special issue |
| Beschreibung: | 338 S. Ill., graph. Darst. |
Internformat
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| 300 | |a 338 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| index_date | 2024-07-02T16:09:03Z |
| indexdate | 2024-07-09T20:48:27Z |
| institution | BVB |
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| language | English |
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| physical | 338 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
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| publisher | Pergamon |
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| spelling | Symposium Advanced Characterisation of Semiconductor Materials 2000 Straßburg Verfasser (DE-588)5529785-7 aut Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France Oxford [u.a.] Pergamon 2001 338 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Materials science in semiconductor processing ; 4 (2001),1/3 : Special issue Halbleiter (DE-588)4022993-2 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronenmikroskop (DE-588)4014326-0 s DE-604 Halbleiter (DE-588)4022993-2 s Rastersondenmikroskopie (DE-588)4330328-6 s Raineri, Vito Sonstige oth European Materials Research Society Sonstige (DE-588)5000064-0 oth |
| spellingShingle | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France Halbleiter (DE-588)4022993-2 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4330328-6 (DE-588)4014326-0 (DE-588)1071861417 |
| title | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_auth | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_exact_search | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_exact_search_txtP | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_full | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_fullStr | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_full_unstemmed | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials May 30 - June 2, 2000, Strasbourg, France |
| title_short | Papers presented at the EMRS 2000 spring meeting, Symposium M: Advanced Characterisation of Semiconductor Materials |
| title_sort | papers presented at the emrs 2000 spring meeting symposium m advanced characterisation of semiconductor materials may 30 june 2 2000 strasbourg france |
| title_sub | May 30 - June 2, 2000, Strasbourg, France |
| topic | Halbleiter (DE-588)4022993-2 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| topic_facet | Halbleiter Rastersondenmikroskopie Elektronenmikroskop Konferenzschrift |
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