Reliability of electron devices, failure physics and analysis:
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Oxford
Pergamon
2001
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben. - In: Microelectronics reliability ; 41 (2001),9/10 : Special issue |
| Beschreibung: | IX S., S. 1273 - 1736, III S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021965917 | ||
| 003 | DE-604 | ||
| 005 | 20040302000000.0 | ||
| 007 | t | ||
| 008 | 020719s2001 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)248473029 | ||
| 035 | |a (DE-599)BVBBV021965917 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 245 | 1 | 0 | |a Reliability of electron devices, failure physics and analysis |c [12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ... |
| 264 | 1 | |a Oxford |b Pergamon |c 2001 | |
| 300 | |a IX S., S. 1273 - 1736, III S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben. - In: Microelectronics reliability ; 41 (2001),9/10 : Special issue | ||
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Schaden |0 (DE-588)4125902-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Netzwerkanalyse |0 (DE-588)4075298-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Netzwerkanalyse |0 (DE-588)4075298-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Schaden |0 (DE-588)4125902-6 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Touboul, André |e Sonstige |4 oth | |
| 711 | 2 | |a ESREF |n 12 |d 2001 |c Arcachon |j Sonstige |0 (DE-588)10143419-4 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015181067 | ||
Datensatz im Suchindex
| _version_ | 1804135935256821760 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021965917 |
| ctrlnum | (OCoLC)248473029 (DE-599)BVBBV021965917 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01488nam a2200385zc 4500</leader><controlfield tag="001">BV021965917</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040302000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020719s2001 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)248473029</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021965917</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability of electron devices, failure physics and analysis</subfield><subfield code="c">[12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford</subfield><subfield code="b">Pergamon</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX S., S. 1273 - 1736, III S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben. - In: Microelectronics reliability ; 41 (2001),9/10 : Special issue</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schaden</subfield><subfield code="0">(DE-588)4125902-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Netzwerkanalyse</subfield><subfield code="0">(DE-588)4075298-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Netzwerkanalyse</subfield><subfield code="0">(DE-588)4075298-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Schaden</subfield><subfield code="0">(DE-588)4125902-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Touboul, André</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">ESREF</subfield><subfield code="n">12</subfield><subfield code="d">2001</subfield><subfield code="c">Arcachon</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)10143419-4</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015181067</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021965917 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:08:54Z |
| indexdate | 2024-07-09T20:48:24Z |
| institution | BVB |
| institution_GND | (DE-588)10143419-4 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015181067 |
| oclc_num | 248473029 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | IX S., S. 1273 - 1736, III S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Pergamon |
| record_format | marc |
| spelling | Reliability of electron devices, failure physics and analysis [12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ... Oxford Pergamon 2001 IX S., S. 1273 - 1736, III S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Microelectronics reliability ; 41 (2001),9/10 : Special issue Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Schaden (DE-588)4125902-6 gnd rswk-swf Netzwerkanalyse (DE-588)4075298-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Netzwerkanalyse (DE-588)4075298-7 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Schaden (DE-588)4125902-6 s Touboul, André Sonstige oth ESREF 12 2001 Arcachon Sonstige (DE-588)10143419-4 oth |
| spellingShingle | Reliability of electron devices, failure physics and analysis Elektronische Schaltung (DE-588)4113419-9 gnd Schaden (DE-588)4125902-6 gnd Netzwerkanalyse (DE-588)4075298-7 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4125902-6 (DE-588)4075298-7 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis |
| title_auth | Reliability of electron devices, failure physics and analysis |
| title_exact_search | Reliability of electron devices, failure physics and analysis |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis |
| title_full | Reliability of electron devices, failure physics and analysis [12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ... |
| title_fullStr | Reliability of electron devices, failure physics and analysis [12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ... |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis [12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001)]. Guest ed. A. Touboul ... |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis |
| topic | Elektronische Schaltung (DE-588)4113419-9 gnd Schaden (DE-588)4125902-6 gnd Netzwerkanalyse (DE-588)4075298-7 gnd |
| topic_facet | Elektronische Schaltung Schaden Netzwerkanalyse Konferenzschrift |
| work_keys_str_mv | AT touboulandre reliabilityofelectrondevicesfailurephysicsandanalysis AT esrefarcachon reliabilityofelectrondevicesfailurephysicsandanalysis |