Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
2002
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| Schlagworte: | |
| Online-Zugang: | https://nbn-resolving.org/urn:nbn:de:bvb:706-176 kostenfrei |
| Beschreibung: | 1 Online-Ressource |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021964325 | ||
| 003 | DE-604 | ||
| 005 | 20180705 | ||
| 006 | a m||| 00||| | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 020204s2002 |||| o||u| ||||||eng d | ||
| 024 | 7 | |a urn:nbn:de:bvb:706-176 |2 urn | |
| 035 | |a (OCoLC)633889944 | ||
| 035 | |a (DE-599)BVBBV021964325 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 |a DE-384 |a DE-473 |a DE-703 |a DE-1051 |a DE-824 |a DE-29 |a DE-12 |a DE-91 |a DE-19 |a DE-1049 |a DE-92 |a DE-739 |a DE-898 |a DE-355 |a DE-20 |a DE-1102 | ||
| 100 | 1 | |a Kottantharayil, Anil |d 1971- |e Verfasser |0 (DE-588)123536936 |4 aut | |
| 245 | 1 | 0 | |a Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |c Anil Kottantharayil |
| 264 | 1 | |c 2002 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 344 | |h 1783 Kb | ||
| 502 | |a Neubiberg, Univ. der Bundeswehr München, Diss., 2001 | ||
| 650 | 0 | 7 | |a Heißes Elektron |0 (DE-588)4159455-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektron-Phonon-Wechselwirkung |0 (DE-588)4140167-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Stoßionisation |0 (DE-588)4183433-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektron-Elektron-Wechselwirkung |0 (DE-588)4151859-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Elektron-Phonon-Wechselwirkung |0 (DE-588)4140167-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektron-Elektron-Wechselwirkung |0 (DE-588)4151859-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Heißes Elektron |0 (DE-588)4159455-1 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Stoßionisation |0 (DE-588)4183433-1 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
| 689 | 4 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Kottantharayil, Anil |t Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| 856 | 4 | |u https://nbn-resolving.org/urn:nbn:de:bvb:706-176 |x Resolving-System | |
| 856 | 4 | 0 | |u https://athene-forschung.unibw.de/85277 |x Verlag |z kostenfrei |3 Volltext |
| 912 | |a ebook | ||
Datensatz im Suchindex
| _version_ | 1805074445583253504 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Kottantharayil, Anil 1971- |
| author_GND | (DE-588)123536936 |
| author_facet | Kottantharayil, Anil 1971- |
| author_role | aut |
| author_sort | Kottantharayil, Anil 1971- |
| author_variant | a k ak |
| building | Verbundindex |
| bvnumber | BV021964325 |
| collection | ebook |
| ctrlnum | (OCoLC)633889944 (DE-599)BVBBV021964325 |
| format | Thesis Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV021964325</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180705</controlfield><controlfield tag="006">a m||| 00|||</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">020204s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">urn:nbn:de:bvb:706-176</subfield><subfield code="2">urn</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633889944</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021964325</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-473</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-1051</subfield><subfield code="a">DE-824</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-1049</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-1102</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kottantharayil, Anil</subfield><subfield code="d">1971-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)123536936</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors</subfield><subfield code="c">Anil Kottantharayil</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="344" ind1=" " ind2=" "><subfield code="h">1783 Kb</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Neubiberg, Univ. der Bundeswehr München, Diss., 2001</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Heißes Elektron</subfield><subfield code="0">(DE-588)4159455-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektron-Phonon-Wechselwirkung</subfield><subfield code="0">(DE-588)4140167-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Stoßionisation</subfield><subfield code="0">(DE-588)4183433-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektron-Elektron-Wechselwirkung</subfield><subfield code="0">(DE-588)4151859-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektron-Phonon-Wechselwirkung</subfield><subfield code="0">(DE-588)4140167-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektron-Elektron-Wechselwirkung</subfield><subfield code="0">(DE-588)4151859-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Heißes Elektron</subfield><subfield code="0">(DE-588)4159455-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Stoßionisation</subfield><subfield code="0">(DE-588)4183433-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Kottantharayil, Anil</subfield><subfield code="t">Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">https://nbn-resolving.org/urn:nbn:de:bvb:706-176</subfield><subfield code="x">Resolving-System</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://athene-forschung.unibw.de/85277</subfield><subfield code="x">Verlag</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ebook</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV021964325 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:08:45Z |
| indexdate | 2024-07-20T05:25:37Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015179475 |
| oclc_num | 633889944 |
| open_access_boolean | 1 |
| owner | DE-706 DE-384 DE-473 DE-BY-UBG DE-703 DE-1051 DE-824 DE-29 DE-12 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-1049 DE-92 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-20 DE-1102 |
| owner_facet | DE-706 DE-384 DE-473 DE-BY-UBG DE-703 DE-1051 DE-824 DE-29 DE-12 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-1049 DE-92 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-20 DE-1102 |
| physical | 1 Online-Ressource |
| psigel | ebook |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| record_format | marc |
| spelling | Kottantharayil, Anil 1971- Verfasser (DE-588)123536936 aut Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil 2002 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier 1783 Kb Neubiberg, Univ. der Bundeswehr München, Diss., 2001 Heißes Elektron (DE-588)4159455-1 gnd rswk-swf Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd rswk-swf Stoßionisation (DE-588)4183433-1 gnd rswk-swf Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 s DE-604 Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 s Heißes Elektron (DE-588)4159455-1 s Stoßionisation (DE-588)4183433-1 s MOS-FET (DE-588)4207266-9 s Erscheint auch als Druck-Ausgabe Kottantharayil, Anil Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors https://nbn-resolving.org/urn:nbn:de:bvb:706-176 Resolving-System https://athene-forschung.unibw.de/85277 Verlag kostenfrei Volltext |
| spellingShingle | Kottantharayil, Anil 1971- Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Heißes Elektron (DE-588)4159455-1 gnd Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd Stoßionisation (DE-588)4183433-1 gnd Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd MOS-FET (DE-588)4207266-9 gnd |
| subject_GND | (DE-588)4159455-1 (DE-588)4140167-0 (DE-588)4183433-1 (DE-588)4151859-7 (DE-588)4207266-9 (DE-588)4113937-9 |
| title | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| title_auth | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| title_exact_search | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| title_exact_search_txtP | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| title_full | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
| title_fullStr | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
| title_full_unstemmed | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
| title_short | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
| title_sort | low voltage hot carrier issues in deep sub micron metal oxide semiconductor field effect transistors |
| topic | Heißes Elektron (DE-588)4159455-1 gnd Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd Stoßionisation (DE-588)4183433-1 gnd Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd MOS-FET (DE-588)4207266-9 gnd |
| topic_facet | Heißes Elektron Elektron-Phonon-Wechselwirkung Stoßionisation Elektron-Elektron-Wechselwirkung MOS-FET Hochschulschrift |
| url | https://nbn-resolving.org/urn:nbn:de:bvb:706-176 https://athene-forschung.unibw.de/85277 |
| work_keys_str_mv | AT kottantharayilanil lowvoltagehotcarrierissuesindeepsubmicronmetaloxidesemiconductorfieldeffecttransistors |