Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors:
Gespeichert in:
1. Verfasser: | |
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Format: | Abschlussarbeit Buch |
Sprache: | English |
Veröffentlicht: |
2002
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Schlagworte: | |
Beschreibung: | VIII, 148 S. graph. Darst. |
Internformat
MARC
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100 | 1 | |a Kottantharayil, Anil |d 1971- |e Verfasser |0 (DE-588)123536936 |4 aut | |
245 | 1 | 0 | |a Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |c Anil Kottantharayil |
264 | 1 | |c 2002 | |
300 | |a VIII, 148 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
502 | |a Neubiberg, Univ. der Bundeswehr München, Diss., 2001 | ||
650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektron-Elektron-Wechselwirkung |0 (DE-588)4151859-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Heißes Elektron |0 (DE-588)4159455-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektron-Phonon-Wechselwirkung |0 (DE-588)4140167-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Stoßionisation |0 (DE-588)4183433-1 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
689 | 0 | 0 | |a Elektron-Phonon-Wechselwirkung |0 (DE-588)4140167-0 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektron-Elektron-Wechselwirkung |0 (DE-588)4151859-7 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Heißes Elektron |0 (DE-588)4159455-1 |D s |
689 | 2 | |5 DE-604 | |
689 | 3 | 0 | |a Stoßionisation |0 (DE-588)4183433-1 |D s |
689 | 3 | |5 DE-604 | |
689 | 4 | 0 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
689 | 4 | |5 DE-604 | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |t Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
999 | |a oai:aleph.bib-bvb.de:BVB01-015179418 |
Datensatz im Suchindex
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Kottantharayil, Anil 1971- |
author_GND | (DE-588)123536936 |
author_facet | Kottantharayil, Anil 1971- |
author_role | aut |
author_sort | Kottantharayil, Anil 1971- |
author_variant | a k ak |
building | Verbundindex |
bvnumber | BV021964268 |
ctrlnum | (OCoLC)633889944 (DE-599)BVBBV021964268 |
format | Thesis Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV021964268 |
illustrated | Illustrated |
index_date | 2024-07-02T16:08:44Z |
indexdate | 2024-07-09T20:48:22Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015179418 |
oclc_num | 633889944 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | VIII, 148 S. graph. Darst. |
publishDate | 2002 |
publishDateSearch | 2002 |
publishDateSort | 2002 |
record_format | marc |
spelling | Kottantharayil, Anil 1971- Verfasser (DE-588)123536936 aut Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil 2002 VIII, 148 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Neubiberg, Univ. der Bundeswehr München, Diss., 2001 MOS-FET (DE-588)4207266-9 gnd rswk-swf Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd rswk-swf Heißes Elektron (DE-588)4159455-1 gnd rswk-swf Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd rswk-swf Stoßionisation (DE-588)4183433-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 s DE-604 Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 s Heißes Elektron (DE-588)4159455-1 s Stoßionisation (DE-588)4183433-1 s MOS-FET (DE-588)4207266-9 s Erscheint auch als Online-Ausgabe Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
spellingShingle | Kottantharayil, Anil 1971- Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors MOS-FET (DE-588)4207266-9 gnd Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd Heißes Elektron (DE-588)4159455-1 gnd Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd Stoßionisation (DE-588)4183433-1 gnd |
subject_GND | (DE-588)4207266-9 (DE-588)4151859-7 (DE-588)4159455-1 (DE-588)4140167-0 (DE-588)4183433-1 (DE-588)4113937-9 |
title | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
title_auth | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
title_exact_search | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
title_exact_search_txtP | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
title_full | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
title_fullStr | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
title_full_unstemmed | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors Anil Kottantharayil |
title_short | Low voltage hot-carrier issues in deep-sub-micron metal-oxide-semiconductor field-effect-transistors |
title_sort | low voltage hot carrier issues in deep sub micron metal oxide semiconductor field effect transistors |
topic | MOS-FET (DE-588)4207266-9 gnd Elektron-Elektron-Wechselwirkung (DE-588)4151859-7 gnd Heißes Elektron (DE-588)4159455-1 gnd Elektron-Phonon-Wechselwirkung (DE-588)4140167-0 gnd Stoßionisation (DE-588)4183433-1 gnd |
topic_facet | MOS-FET Elektron-Elektron-Wechselwirkung Heißes Elektron Elektron-Phonon-Wechselwirkung Stoßionisation Hochschulschrift |
work_keys_str_mv | AT kottantharayilanil lowvoltagehotcarrierissuesindeepsubmicronmetaloxidesemiconductorfieldeffecttransistors |