The use of the scanning electron microscope:
Gespeichert in:
Hauptverfasser: | , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Oxford [u.a.]
Pergamon Press
1972
|
Ausgabe: | 1. ed. |
Schlagworte: | |
Beschreibung: | 278 S. zahlr. Ill. |
ISBN: | 0080162460 |
Internformat
MARC
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003 | DE-604 | ||
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007 | t | ||
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035 | |a (OCoLC)539894 | ||
035 | |a (DE-599)BVBBV021962580 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
050 | 0 | |a QH212.S3 | |
082 | 0 | |a 502/.8 | |
084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
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100 | 1 | |a Hearle, John W. S. |e Verfasser |4 aut | |
245 | 1 | 0 | |a The use of the scanning electron microscope |c by J. W. S. Hearle ; J. T. Sparrow ; P. M. Cross |
250 | |a 1. ed. | ||
264 | 1 | |a Oxford [u.a.] |b Pergamon Press |c 1972 | |
300 | |a 278 S. |b zahlr. Ill. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 7 | |a Elektronenmicroscopie |2 gtt | |
650 | 7 | |a Instrumentacao (Fisica) |2 larpcal | |
650 | 7 | |a Metalografia |2 larpcal | |
650 | 4 | |a Microscopes électroniques à balayage | |
650 | 7 | |a Microscopia Eletronica |2 larpcal | |
650 | 7 | |a Microscopie |2 gtt | |
650 | 7 | |a Scanning |2 gtt | |
650 | 4 | |a Microscopy, Electron, Scanning | |
650 | 4 | |a Scanning electron microscopes | |
650 | 0 | 7 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektrooptik |0 (DE-588)4137456-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Anwendung |0 (DE-588)4196864-5 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektrooptik |0 (DE-588)4137456-3 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |D s |
689 | 1 | 1 | |a Anwendung |0 (DE-588)4196864-5 |D s |
689 | 1 | |8 1\p |5 DE-604 | |
700 | 1 | |a Sparrow, J. T. |e Verfasser |4 aut | |
700 | 1 | |a Cross, Patricia Margaret |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015177730 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Hearle, John W. S. Sparrow, J. T. Cross, Patricia Margaret |
author_facet | Hearle, John W. S. Sparrow, J. T. Cross, Patricia Margaret |
author_role | aut aut aut |
author_sort | Hearle, John W. S. |
author_variant | j w s h jws jwsh j t s jt jts p m c pm pmc |
building | Verbundindex |
bvnumber | BV021962580 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.S3 |
callnumber-search | QH212.S3 |
callnumber-sort | QH 3212 S3 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | UH 6300 WC 3100 |
ctrlnum | (OCoLC)539894 (DE-599)BVBBV021962580 |
dewey-full | 502/.8 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8 |
dewey-search | 502/.8 |
dewey-sort | 3502 18 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Biologie |
discipline_str_mv | Allgemeine Naturwissenschaft Physik Biologie |
edition | 1. ed. |
format | Book |
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id | DE-604.BV021962580 |
illustrated | Illustrated |
index_date | 2024-07-02T16:08:33Z |
indexdate | 2024-07-09T20:48:20Z |
institution | BVB |
isbn | 0080162460 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015177730 |
oclc_num | 539894 |
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owner | DE-706 |
owner_facet | DE-706 |
physical | 278 S. zahlr. Ill. |
publishDate | 1972 |
publishDateSearch | 1972 |
publishDateSort | 1972 |
publisher | Pergamon Press |
record_format | marc |
spelling | Hearle, John W. S. Verfasser aut The use of the scanning electron microscope by J. W. S. Hearle ; J. T. Sparrow ; P. M. Cross 1. ed. Oxford [u.a.] Pergamon Press 1972 278 S. zahlr. Ill. txt rdacontent n rdamedia nc rdacarrier Elektronenmicroscopie gtt Instrumentacao (Fisica) larpcal Metalografia larpcal Microscopes électroniques à balayage Microscopia Eletronica larpcal Microscopie gtt Scanning gtt Microscopy, Electron, Scanning Scanning electron microscopes Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Elektrooptik (DE-588)4137456-3 gnd rswk-swf Anwendung (DE-588)4196864-5 gnd rswk-swf Elektrooptik (DE-588)4137456-3 s DE-604 Elektronenmikroskop (DE-588)4014326-0 s Anwendung (DE-588)4196864-5 s 1\p DE-604 Sparrow, J. T. Verfasser aut Cross, Patricia Margaret Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Hearle, John W. S. Sparrow, J. T. Cross, Patricia Margaret The use of the scanning electron microscope Elektronenmicroscopie gtt Instrumentacao (Fisica) larpcal Metalografia larpcal Microscopes électroniques à balayage Microscopia Eletronica larpcal Microscopie gtt Scanning gtt Microscopy, Electron, Scanning Scanning electron microscopes Elektronenmikroskop (DE-588)4014326-0 gnd Elektrooptik (DE-588)4137456-3 gnd Anwendung (DE-588)4196864-5 gnd |
subject_GND | (DE-588)4014326-0 (DE-588)4137456-3 (DE-588)4196864-5 |
title | The use of the scanning electron microscope |
title_auth | The use of the scanning electron microscope |
title_exact_search | The use of the scanning electron microscope |
title_exact_search_txtP | The use of the scanning electron microscope |
title_full | The use of the scanning electron microscope by J. W. S. Hearle ; J. T. Sparrow ; P. M. Cross |
title_fullStr | The use of the scanning electron microscope by J. W. S. Hearle ; J. T. Sparrow ; P. M. Cross |
title_full_unstemmed | The use of the scanning electron microscope by J. W. S. Hearle ; J. T. Sparrow ; P. M. Cross |
title_short | The use of the scanning electron microscope |
title_sort | the use of the scanning electron microscope |
topic | Elektronenmicroscopie gtt Instrumentacao (Fisica) larpcal Metalografia larpcal Microscopes électroniques à balayage Microscopia Eletronica larpcal Microscopie gtt Scanning gtt Microscopy, Electron, Scanning Scanning electron microscopes Elektronenmikroskop (DE-588)4014326-0 gnd Elektrooptik (DE-588)4137456-3 gnd Anwendung (DE-588)4196864-5 gnd |
topic_facet | Elektronenmicroscopie Instrumentacao (Fisica) Metalografia Microscopes électroniques à balayage Microscopia Eletronica Microscopie Scanning Microscopy, Electron, Scanning Scanning electron microscopes Elektronenmikroskop Elektrooptik Anwendung |
work_keys_str_mv | AT hearlejohnws theuseofthescanningelectronmicroscope AT sparrowjt theuseofthescanningelectronmicroscope AT crosspatriciamargaret theuseofthescanningelectronmicroscope |