Scanning Probe Microscopy: [ held at Atagawa Haitsu, Shizuoka from December 9 to 11, 1999 ]
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Tokyo Japan Soc. of Applied Physics 2000
Subjects:
Item Description:Literaturangaben. - In: Japanese journal of applied physics : 1 ; 39 (2000),6B : Special issue
Physical Description:S. 3701 - 3833 Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!