(2000). Scanning Probe Microscopy: [ held at Atagawa Haitsu, Shizuoka from December 9 to 11, 1999 ]. Japan Soc. of Applied Physics.
Chicago Style (17th ed.) CitationScanning Probe Microscopy: [ Held at Atagawa Haitsu, Shizuoka from December 9 to 11, 1999 ]. Tokyo: Japan Soc. of Applied Physics, 2000.
MLA (9th ed.) CitationScanning Probe Microscopy: [ Held at Atagawa Haitsu, Shizuoka from December 9 to 11, 1999 ]. Japan Soc. of Applied Physics, 2000.
Warning: These citations may not always be 100% accurate.