Reliability of electron devices, failure physics and analysis:
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Oxford
Pergamon
2000
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben. - In: Microelectronics reliability ; 40 (2000),8/10 : Special issue |
| Beschreibung: | VIII S., S. 1243 - 1770, III S. Ill., graph. Darst. |
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Datensatz im Suchindex
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| physical | VIII S., S. 1243 - 1770, III S. Ill., graph. Darst. |
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| spelling | Reliability of electron devices, failure physics and analysis [11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000)]. Guest ed. L. J. Balk ... Oxford Pergamon 2000 VIII S., S. 1243 - 1770, III S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Microelectronics reliability ; 40 (2000),8/10 : Special issue Schaden (DE-588)4125902-6 gnd rswk-swf Netzwerkanalyse (DE-588)4075298-7 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Netzwerkanalyse (DE-588)4075298-7 s Elektronische Schaltung (DE-588)4113419-9 s Schaden (DE-588)4125902-6 s 1\p DE-604 DE-604 Balk, Ludwig J. Sonstige oth ESREF 11 2000 Dresden Sonstige (DE-588)6021317-6 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reliability of electron devices, failure physics and analysis Schaden (DE-588)4125902-6 gnd Netzwerkanalyse (DE-588)4075298-7 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| subject_GND | (DE-588)4125902-6 (DE-588)4075298-7 (DE-588)4113419-9 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis |
| title_auth | Reliability of electron devices, failure physics and analysis |
| title_exact_search | Reliability of electron devices, failure physics and analysis |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis |
| title_full | Reliability of electron devices, failure physics and analysis [11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000)]. Guest ed. L. J. Balk ... |
| title_fullStr | Reliability of electron devices, failure physics and analysis [11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000)]. Guest ed. L. J. Balk ... |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis [11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000)]. Guest ed. L. J. Balk ... |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis |
| topic | Schaden (DE-588)4125902-6 gnd Netzwerkanalyse (DE-588)4075298-7 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| topic_facet | Schaden Netzwerkanalyse Elektronische Schaltung Konferenzschrift |
| work_keys_str_mv | AT balkludwigj reliabilityofelectrondevicesfailurephysicsandanalysis AT esrefdresden reliabilityofelectrondevicesfailurephysicsandanalysis |