Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors: June 1 - 4, 1999, Strasbourg, France
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2000
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben. - In: Materials science & engineering / B ; 71 (2000) |
| Beschreibung: | VII, 340 S. Ill., graph. Darst. |
Internformat
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Datensatz im Suchindex
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| index_date | 2024-07-02T16:07:58Z |
| indexdate | 2024-07-09T20:48:10Z |
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| physical | VII, 340 S. Ill., graph. Darst. |
| publishDate | 2000 |
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| spelling | Symposium Process Induced Defects in Semiconductors 1999 Straßburg Verfasser (DE-588)3044395-7 aut Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France Amsterdam [u.a.] Elsevier 2000 VII, 340 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Materials science & engineering / B ; 71 (2000) Halbleiter (DE-588)4022993-2 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleiter (DE-588)4022993-2 s DE-604 Störstelle (DE-588)4193400-3 s Mesli, A. Sonstige oth European Materials Research Society Sonstige (DE-588)5000064-0 oth |
| spellingShingle | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France Halbleiter (DE-588)4022993-2 gnd Störstelle (DE-588)4193400-3 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4193400-3 (DE-588)1071861417 |
| title | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_auth | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_exact_search | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_exact_search_txtP | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_full | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_fullStr | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_full_unstemmed | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors June 1 - 4, 1999, Strasbourg, France |
| title_short | Papers presented at the European Materials Research Society 1999 spring meeting, Symposium F: Process Induced Defects in Semiconductors |
| title_sort | papers presented at the european materials research society 1999 spring meeting symposium f process induced defects in semiconductors june 1 4 1999 strasbourg france |
| title_sub | June 1 - 4, 1999, Strasbourg, France |
| topic | Halbleiter (DE-588)4022993-2 gnd Störstelle (DE-588)4193400-3 gnd |
| topic_facet | Halbleiter Störstelle Konferenzschrift |
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