Holdings: Semiconductor material and device characterization

Semiconductor material and device characterization:

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Bibliographic Details
Main Author:	Schroder, Dieter K. (Author)
Format:	Book
Language:	English
Published:	New York, NY [u.a.] Wiley c 1990
Edition:	[Nachdr.]
Series:	A Wiley-Interscience publication
Subjects:	Semiconducteurs Semiconducteurs - Essais Semiconductors Semiconductors > Testing Halbleiter Halbleiterwerkstoff Prüftechnik Halbleiterschaltung Halbleiterbauelement
Item Description:	Literaturangaben
Physical Description:	XV, 599 S. graph. Darst.
ISBN:	0471511048

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MARC


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Record in the Search Index

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edition	[Nachdr.]
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id	DE-604.BV021938464
illustrated	Illustrated
index_date	2024-07-02T16:06:46Z
indexdate	2024-07-09T20:47:49Z
institution	BVB
isbn	0471511048
language	English
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owner	DE-706
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physical	XV, 599 S. graph. Darst.
publishDate	1990
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publisher	Wiley
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series2	A Wiley-Interscience publication
spelling	Schroder, Dieter K. Verfasser aut Semiconductor material and device characterization Dieter K. Schroder [Nachdr.] New York, NY [u.a.] Wiley c 1990 XV, 599 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication Literaturangaben Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Halbleiter (DE-588)4022993-2 s 2\p DE-604 Halbleiterbauelement (DE-588)4113826-0 s 3\p DE-604 Halbleiterwerkstoff (DE-588)4158817-4 s 4\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Schroder, Dieter K. Semiconductor material and device characterization Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd
subject_GND	(DE-588)4022993-2 (DE-588)4158817-4 (DE-588)4047610-8 (DE-588)4158811-3 (DE-588)4113826-0
title	Semiconductor material and device characterization
title_auth	Semiconductor material and device characterization
title_exact_search	Semiconductor material and device characterization
title_exact_search_txtP	Semiconductor material and device characterization
title_full	Semiconductor material and device characterization Dieter K. Schroder
title_fullStr	Semiconductor material and device characterization Dieter K. Schroder
title_full_unstemmed	Semiconductor material and device characterization Dieter K. Schroder
title_short	Semiconductor material and device characterization
title_sort	semiconductor material and device characterization
topic	Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd
topic_facet	Semiconducteurs Semiconducteurs - Essais Semiconductors Semiconductors Testing Halbleiter Halbleiterwerkstoff Prüftechnik Halbleiterschaltung Halbleiterbauelement
work_keys_str_mv	AT schroderdieterk semiconductormaterialanddevicecharacterization

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