Semiconductor material and device characterization:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY [u.a.]
Wiley
c 1990
|
Ausgabe: | [Nachdr.] |
Schriftenreihe: | A Wiley-Interscience publication
|
Schlagworte: | |
Beschreibung: | Literaturangaben |
Beschreibung: | XV, 599 S. graph. Darst. |
ISBN: | 0471511048 |
Internformat
MARC
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035 | |a (DE-599)BVBBV021938464 | ||
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050 | 0 | |a QC611 | |
082 | 0 | |a 621.381/52 |2 20 | |
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100 | 1 | |a Schroder, Dieter K. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Semiconductor material and device characterization |c Dieter K. Schroder |
250 | |a [Nachdr.] | ||
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650 | 4 | |a Semiconducteurs - Essais | |
650 | 7 | |a Semiconducteurs |2 ram | |
650 | 4 | |a Semiconductors | |
650 | 4 | |a Semiconductors |x Testing | |
650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |2 gnd |9 rswk-swf |
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650 | 0 | 7 | |a Halbleiterschaltung |0 (DE-588)4158811-3 |2 gnd |9 rswk-swf |
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689 | 0 | 0 | |a Halbleiterschaltung |0 (DE-588)4158811-3 |D s |
689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
689 | 1 | 0 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
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689 | 1 | |8 2\p |5 DE-604 | |
689 | 2 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
689 | 2 | |8 3\p |5 DE-604 | |
689 | 3 | 0 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |D s |
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Datensatz im Suchindex
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---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Schroder, Dieter K. |
author_facet | Schroder, Dieter K. |
author_role | aut |
author_sort | Schroder, Dieter K. |
author_variant | d k s dk dks |
building | Verbundindex |
bvnumber | BV021938464 |
callnumber-first | Q - Science |
callnumber-label | QC611 |
callnumber-raw | QC611 |
callnumber-search | QC611 |
callnumber-sort | QC 3611 |
callnumber-subject | QC - Physics |
classification_rvk | UP 2800 |
ctrlnum | (OCoLC)20492380 (DE-599)BVBBV021938464 |
dewey-full | 621.381/52 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381/52 |
dewey-search | 621.381/52 |
dewey-sort | 3621.381 252 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | [Nachdr.] |
format | Book |
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id | DE-604.BV021938464 |
illustrated | Illustrated |
index_date | 2024-07-02T16:06:46Z |
indexdate | 2024-07-09T20:47:49Z |
institution | BVB |
isbn | 0471511048 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015153614 |
oclc_num | 20492380 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | XV, 599 S. graph. Darst. |
publishDate | 1990 |
publishDateSearch | 1990 |
publishDateSort | 1990 |
publisher | Wiley |
record_format | marc |
series2 | A Wiley-Interscience publication |
spelling | Schroder, Dieter K. Verfasser aut Semiconductor material and device characterization Dieter K. Schroder [Nachdr.] New York, NY [u.a.] Wiley c 1990 XV, 599 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication Literaturangaben Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Halbleiter (DE-588)4022993-2 s 2\p DE-604 Halbleiterbauelement (DE-588)4113826-0 s 3\p DE-604 Halbleiterwerkstoff (DE-588)4158817-4 s 4\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Schroder, Dieter K. Semiconductor material and device characterization Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
subject_GND | (DE-588)4022993-2 (DE-588)4158817-4 (DE-588)4047610-8 (DE-588)4158811-3 (DE-588)4113826-0 |
title | Semiconductor material and device characterization |
title_auth | Semiconductor material and device characterization |
title_exact_search | Semiconductor material and device characterization |
title_exact_search_txtP | Semiconductor material and device characterization |
title_full | Semiconductor material and device characterization Dieter K. Schroder |
title_fullStr | Semiconductor material and device characterization Dieter K. Schroder |
title_full_unstemmed | Semiconductor material and device characterization Dieter K. Schroder |
title_short | Semiconductor material and device characterization |
title_sort | semiconductor material and device characterization |
topic | Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
topic_facet | Semiconducteurs Semiconducteurs - Essais Semiconductors Semiconductors Testing Halbleiter Halbleiterwerkstoff Prüftechnik Halbleiterschaltung Halbleiterbauelement |
work_keys_str_mv | AT schroderdieterk semiconductormaterialanddevicecharacterization |