ADC modelling: special issue
Gespeichert in:
Format: | Buch |
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Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
1996
|
Schlagworte: | |
Beschreibung: | In: Measurement ; 19 (1996), 3/4 |
Beschreibung: | S. 129 - 230 Ill., graph. Darst. |
Internformat
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illustrated | Illustrated |
index_date | 2024-07-02T16:06:38Z |
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language | English |
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spelling | ADC modelling special issue Amsterdam [u.a.] Elsevier 1996 S. 129 - 230 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier In: Measurement ; 19 (1996), 3/4 VLSI (DE-588)4117388-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Analog-Digital-Umsetzer (DE-588)4128359-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Analog-Digital-Umsetzer (DE-588)4128359-4 s VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s DE-604 |
spellingShingle | ADC modelling special issue VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd Analog-Digital-Umsetzer (DE-588)4128359-4 gnd |
subject_GND | (DE-588)4117388-0 (DE-588)4059549-3 (DE-588)4128359-4 (DE-588)1071861417 |
title | ADC modelling special issue |
title_auth | ADC modelling special issue |
title_exact_search | ADC modelling special issue |
title_exact_search_txtP | ADC modelling special issue |
title_full | ADC modelling special issue |
title_fullStr | ADC modelling special issue |
title_full_unstemmed | ADC modelling special issue |
title_short | ADC modelling |
title_sort | adc modelling special issue |
title_sub | special issue |
topic | VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd Analog-Digital-Umsetzer (DE-588)4128359-4 gnd |
topic_facet | VLSI Test Analog-Digital-Umsetzer Konferenzschrift |