Reliability of electron devices, failure physics and analysis:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Oxford [u.a.]
Pergamon
1996
|
| Subjects: | |
| Item Description: | In: Microelectronics and reliability ; 36 (1996), 11/12 |
| Physical Description: | IX, S. 1603 - 1946 Ill., graph. Darst. |
Staff View
MARC
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Record in the Search Index
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| illustrated | Illustrated |
| index_date | 2024-07-02T16:06:27Z |
| indexdate | 2024-07-09T20:47:42Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015148297 |
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| physical | IX, S. 1603 - 1946 Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Pergamon |
| record_format | marc |
| spelling | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... Oxford [u.a.] Pergamon 1996 IX, S. 1603 - 1946 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier In: Microelectronics and reliability ; 36 (1996), 11/12 Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Physik (DE-588)4045956-1 s DE-604 Zuverlässigkeit (DE-588)4059245-5 s Elektronische Schaltung (DE-588)4113419-9 s Groeseneken, Guido Sonstige oth |
| spellingShingle | Reliability of electron devices, failure physics and analysis Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4045956-1 (DE-588)4113419-9 (DE-588)4059245-5 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis |
| title_auth | Reliability of electron devices, failure physics and analysis |
| title_exact_search | Reliability of electron devices, failure physics and analysis |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis |
| title_full | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_fullStr | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis |
| topic | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik Elektronische Schaltung Zuverlässigkeit Konferenzschrift |
| work_keys_str_mv | AT groesenekenguido reliabilityofelectrondevicesfailurephysicsandanalysis |