Reliability of electron devices, failure physics and analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Pergamon
1996
|
| Schlagworte: | |
| Beschreibung: | In: Microelectronics and reliability ; 36 (1996), 11/12 |
| Beschreibung: | IX, S. 1603 - 1946 Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021933142 | ||
| 003 | DE-604 | ||
| 005 | 20040301000000.0 | ||
| 007 | t | ||
| 008 | 970131s1996 ad|| |||| 00||| eng d | ||
| 035 | |a (OCoLC)36316837 | ||
| 035 | |a (DE-599)BVBBV021933142 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a TK7870 | |
| 082 | 0 | |a 621.3815 |b Eu743p, 1996 |2 21 | |
| 245 | 1 | 0 | |a Reliability of electron devices, failure physics and analysis |c guest eds. Guido Groeseneken ... |
| 264 | 1 | |a Oxford [u.a.] |b Pergamon |c 1996 | |
| 300 | |a IX, S. 1603 - 1946 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a In: Microelectronics and reliability ; 36 (1996), 11/12 | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Reliability |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Physik |0 (DE-588)4045956-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Physik |0 (DE-588)4045956-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Groeseneken, Guido |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015148297 | ||
Datensatz im Suchindex
| _version_ | 1804135890717507584 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021933142 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)36316837 (DE-599)BVBBV021933142 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01616nam a2200445zc 4500</leader><controlfield tag="001">BV021933142</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040301000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">970131s1996 ad|| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)36316837</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021933142</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="b">Eu743p, 1996</subfield><subfield code="2">21</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability of electron devices, failure physics and analysis</subfield><subfield code="c">guest eds. Guido Groeseneken ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford [u.a.]</subfield><subfield code="b">Pergamon</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, S. 1603 - 1946</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">In: Microelectronics and reliability ; 36 (1996), 11/12</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Physik</subfield><subfield code="0">(DE-588)4045956-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Physik</subfield><subfield code="0">(DE-588)4045956-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Groeseneken, Guido</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015148297</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021933142 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:06:27Z |
| indexdate | 2024-07-09T20:47:42Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015148297 |
| oclc_num | 36316837 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | IX, S. 1603 - 1946 Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Pergamon |
| record_format | marc |
| spelling | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... Oxford [u.a.] Pergamon 1996 IX, S. 1603 - 1946 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier In: Microelectronics and reliability ; 36 (1996), 11/12 Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Physik (DE-588)4045956-1 s DE-604 Zuverlässigkeit (DE-588)4059245-5 s Elektronische Schaltung (DE-588)4113419-9 s Groeseneken, Guido Sonstige oth |
| spellingShingle | Reliability of electron devices, failure physics and analysis Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4045956-1 (DE-588)4113419-9 (DE-588)4059245-5 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis |
| title_auth | Reliability of electron devices, failure physics and analysis |
| title_exact_search | Reliability of electron devices, failure physics and analysis |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis |
| title_full | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_fullStr | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis guest eds. Guido Groeseneken ... |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis |
| topic | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik (DE-588)4045956-1 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Physik Elektronische Schaltung Zuverlässigkeit Konferenzschrift |
| work_keys_str_mv | AT groesenekenguido reliabilityofelectrondevicesfailurephysicsandanalysis |