Digital systems testing and testable design:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
IEEE Press
c 1990
|
| Ausgabe: | 2., rev. print. |
| Schlagworte: | |
| Beschreibung: | XVII, 652 S. zahlr. graph. Darst. |
| ISBN: | 0780310624 |
Internformat
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Datensatz im Suchindex
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|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
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| author | Abramovici, Miron Breuer, Melvin A. Friedman, Arthur D. |
| author_facet | Abramovici, Miron Breuer, Melvin A. Friedman, Arthur D. |
| author_role | aut aut aut |
| author_sort | Abramovici, Miron |
| author_variant | m a ma m a b ma mab a d f ad adf |
| building | Verbundindex |
| bvnumber | BV021927195 |
| classification_rvk | ST 190 ZN 4030 ZN 5680 |
| ctrlnum | (OCoLC)299825561 (DE-599)BVBBV021927195 |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2., rev. print. |
| format | Book |
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| id | DE-604.BV021927195 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:06:04Z |
| indexdate | 2025-01-10T19:04:49Z |
| institution | BVB |
| isbn | 0780310624 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015142352 |
| oclc_num | 299825561 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XVII, 652 S. zahlr. graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | IEEE Press |
| record_format | marc |
| spelling | Abramovici, Miron Verfasser aut Digital systems testing and testable design Miron Abramovici ; Melvin A. Breuer ; Arthur D. Friedman 2., rev. print. New York [u.a.] IEEE Press c 1990 XVII, 652 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf Prüfung (DE-588)4047609-1 gnd rswk-swf Logische Schaltung (DE-588)4131023-8 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Digitaltechnik (DE-588)4012303-0 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Testkonstruktion (DE-588)4124306-7 gnd rswk-swf Digitales System (DE-588)4012300-5 gnd rswk-swf Testbarkeit (DE-588)4271826-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Digitaltechnik (DE-588)4012303-0 s DE-604 Testkonstruktion (DE-588)4124306-7 s Logische Schaltung (DE-588)4131023-8 s Fehlererkennung (DE-588)4133764-5 s Computersimulation (DE-588)4148259-1 s Digitales System (DE-588)4012300-5 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Testbarkeit (DE-588)4271826-0 s 2\p DE-604 Schaltungsentwurf (DE-588)4179389-4 s 3\p DE-604 VLSI (DE-588)4117388-0 s 4\p DE-604 Prüfung (DE-588)4047609-1 s Breuer, Melvin A. Verfasser aut Friedman, Arthur D. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Abramovici, Miron Breuer, Melvin A. Friedman, Arthur D. Digital systems testing and testable design Schaltungsentwurf (DE-588)4179389-4 gnd Prüfung (DE-588)4047609-1 gnd Logische Schaltung (DE-588)4131023-8 gnd Computersimulation (DE-588)4148259-1 gnd Digitaltechnik (DE-588)4012303-0 gnd VLSI (DE-588)4117388-0 gnd Fehlererkennung (DE-588)4133764-5 gnd Testkonstruktion (DE-588)4124306-7 gnd Digitales System (DE-588)4012300-5 gnd Testbarkeit (DE-588)4271826-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4179389-4 (DE-588)4047609-1 (DE-588)4131023-8 (DE-588)4148259-1 (DE-588)4012303-0 (DE-588)4117388-0 (DE-588)4133764-5 (DE-588)4124306-7 (DE-588)4012300-5 (DE-588)4271826-0 (DE-588)4047610-8 |
| title | Digital systems testing and testable design |
| title_auth | Digital systems testing and testable design |
| title_exact_search | Digital systems testing and testable design |
| title_exact_search_txtP | Digital systems testing and testable design |
| title_full | Digital systems testing and testable design Miron Abramovici ; Melvin A. Breuer ; Arthur D. Friedman |
| title_fullStr | Digital systems testing and testable design Miron Abramovici ; Melvin A. Breuer ; Arthur D. Friedman |
| title_full_unstemmed | Digital systems testing and testable design Miron Abramovici ; Melvin A. Breuer ; Arthur D. Friedman |
| title_short | Digital systems testing and testable design |
| title_sort | digital systems testing and testable design |
| topic | Schaltungsentwurf (DE-588)4179389-4 gnd Prüfung (DE-588)4047609-1 gnd Logische Schaltung (DE-588)4131023-8 gnd Computersimulation (DE-588)4148259-1 gnd Digitaltechnik (DE-588)4012303-0 gnd VLSI (DE-588)4117388-0 gnd Fehlererkennung (DE-588)4133764-5 gnd Testkonstruktion (DE-588)4124306-7 gnd Digitales System (DE-588)4012300-5 gnd Testbarkeit (DE-588)4271826-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Schaltungsentwurf Prüfung Logische Schaltung Computersimulation Digitaltechnik VLSI Fehlererkennung Testkonstruktion Digitales System Testbarkeit Prüftechnik |
| work_keys_str_mv | AT abramovicimiron digitalsystemstestingandtestabledesign AT breuermelvina digitalsystemstestingandtestabledesign AT friedmanarthurd digitalsystemstestingandtestabledesign |