Imperfections and impurities in semiconductor silicon:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York [u.a.]
Wiley
1981
|
| Edition: | 1. print. |
| Series: | Wiley-Interscience publication
|
| Subjects: | |
| Physical Description: | XIV, 379 S. Ill., graph. Darst. |
| ISBN: | 0471078174 |
Staff View
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Record in the Search Index
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| author | Ravi, Kramadhati V. |
| author_facet | Ravi, Kramadhati V. |
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| building | Verbundindex |
| bvnumber | BV021920134 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.8.S5 |
| callnumber-search | QC611.8.S5 |
| callnumber-sort | QC 3611.8 S5 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 3100 |
| ctrlnum | (OCoLC)6735454 (DE-599)BVBBV021920134 |
| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| discipline_str_mv | Physik |
| edition | 1. print. |
| format | Book |
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| id | DE-604.BV021920134 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:05:42Z |
| indexdate | 2024-07-09T20:47:25Z |
| institution | BVB |
| isbn | 0471078174 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015135296 |
| oclc_num | 6735454 |
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| physical | XIV, 379 S. Ill., graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley-Interscience publication |
| spelling | Ravi, Kramadhati V. Verfasser aut Imperfections and impurities in semiconductor silicon K. V. Ravi 1. print. New York [u.a.] Wiley 1981 XIV, 379 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Wiley-Interscience publication Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd rswk-swf Siliciumhalbleiter (DE-588)4274465-9 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 s DE-604 Siliciumhalbleiter (DE-588)4274465-9 s Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Silicium (DE-588)4077445-4 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Ravi, Kramadhati V. Imperfections and impurities in semiconductor silicon Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4274465-9 (DE-588)4125030-8 (DE-588)4158814-9 |
| title | Imperfections and impurities in semiconductor silicon |
| title_auth | Imperfections and impurities in semiconductor silicon |
| title_exact_search | Imperfections and impurities in semiconductor silicon |
| title_exact_search_txtP | Imperfections and impurities in semiconductor silicon |
| title_full | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_fullStr | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_full_unstemmed | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_short | Imperfections and impurities in semiconductor silicon |
| title_sort | imperfections and impurities in semiconductor silicon |
| topic | Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| topic_facet | Semiconductors Defects Silicon Defects Silicium Siliciumhalbleiter Gitterbaufehler Halbleitertechnologie |
| work_keys_str_mv | AT ravikramadhativ imperfectionsandimpuritiesinsemiconductorsilicon |