Imperfections and impurities in semiconductor silicon:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Wiley
1981
|
| Ausgabe: | 1. print. |
| Schriftenreihe: | Wiley-Interscience publication
|
| Schlagworte: | |
| Beschreibung: | XIV, 379 S. Ill., graph. Darst. |
| ISBN: | 0471078174 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021920134 | ||
| 003 | DE-604 | ||
| 005 | 20040301000000.0 | ||
| 007 | t | ||
| 008 | 940908s1981 ad|| |||| 00||| eng d | ||
| 020 | |a 0471078174 |9 0-471-07817-4 | ||
| 035 | |a (OCoLC)6735454 | ||
| 035 | |a (DE-599)BVBBV021920134 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a QC611.8.S5 | |
| 082 | 0 | |a 537.6/22 |2 19 | |
| 084 | |a UP 3100 |0 (DE-625)146372: |2 rvk | ||
| 100 | 1 | |a Ravi, Kramadhati V. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Imperfections and impurities in semiconductor silicon |c K. V. Ravi |
| 250 | |a 1. print. | ||
| 264 | 1 | |a New York [u.a.] |b Wiley |c 1981 | |
| 300 | |a XIV, 379 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Wiley-Interscience publication | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 4 | |a Silicon |x Defects | |
| 650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Siliciumhalbleiter |0 (DE-588)4274465-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleitertechnologie |0 (DE-588)4158814-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleitertechnologie |0 (DE-588)4158814-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Siliciumhalbleiter |0 (DE-588)4274465-9 |D s |
| 689 | 1 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
| 689 | 2 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015135296 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804135873001816064 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Ravi, Kramadhati V. |
| author_facet | Ravi, Kramadhati V. |
| author_role | aut |
| author_sort | Ravi, Kramadhati V. |
| author_variant | k v r kv kvr |
| building | Verbundindex |
| bvnumber | BV021920134 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.8.S5 |
| callnumber-search | QC611.8.S5 |
| callnumber-sort | QC 3611.8 S5 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 3100 |
| ctrlnum | (OCoLC)6735454 (DE-599)BVBBV021920134 |
| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| discipline_str_mv | Physik |
| edition | 1. print. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01757nam a2200505zc 4500</leader><controlfield tag="001">BV021920134</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040301000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940908s1981 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471078174</subfield><subfield code="9">0-471-07817-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)6735454</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021920134</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC611.8.S5</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.6/22</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3100</subfield><subfield code="0">(DE-625)146372:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ravi, Kramadhati V.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Imperfections and impurities in semiconductor silicon</subfield><subfield code="c">K. V. Ravi</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. print.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Wiley</subfield><subfield code="c">1981</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV, 379 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Wiley-Interscience publication</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Siliciumhalbleiter</subfield><subfield code="0">(DE-588)4274465-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleitertechnologie</subfield><subfield code="0">(DE-588)4158814-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleitertechnologie</subfield><subfield code="0">(DE-588)4158814-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Siliciumhalbleiter</subfield><subfield code="0">(DE-588)4274465-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015135296</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV021920134 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:05:42Z |
| indexdate | 2024-07-09T20:47:25Z |
| institution | BVB |
| isbn | 0471078174 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015135296 |
| oclc_num | 6735454 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XIV, 379 S. Ill., graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley-Interscience publication |
| spelling | Ravi, Kramadhati V. Verfasser aut Imperfections and impurities in semiconductor silicon K. V. Ravi 1. print. New York [u.a.] Wiley 1981 XIV, 379 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Wiley-Interscience publication Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd rswk-swf Siliciumhalbleiter (DE-588)4274465-9 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 s DE-604 Siliciumhalbleiter (DE-588)4274465-9 s Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Silicium (DE-588)4077445-4 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Ravi, Kramadhati V. Imperfections and impurities in semiconductor silicon Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4274465-9 (DE-588)4125030-8 (DE-588)4158814-9 |
| title | Imperfections and impurities in semiconductor silicon |
| title_auth | Imperfections and impurities in semiconductor silicon |
| title_exact_search | Imperfections and impurities in semiconductor silicon |
| title_exact_search_txtP | Imperfections and impurities in semiconductor silicon |
| title_full | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_fullStr | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_full_unstemmed | Imperfections and impurities in semiconductor silicon K. V. Ravi |
| title_short | Imperfections and impurities in semiconductor silicon |
| title_sort | imperfections and impurities in semiconductor silicon |
| topic | Semiconductors Defects Silicon Defects Silicium (DE-588)4077445-4 gnd Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| topic_facet | Semiconductors Defects Silicon Defects Silicium Siliciumhalbleiter Gitterbaufehler Halbleitertechnologie |
| work_keys_str_mv | AT ravikramadhativ imperfectionsandimpuritiesinsemiconductorsilicon |