APA-Zitierstil (7. Ausg.)

(1993). Surface characterization by LEED, RHEED, REM, STM, and holography: Proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993. North-Holland.

Chicago-Zitierstil (17. Ausg.)

Surface Characterization by LEED, RHEED, REM, STM, and Holography: Proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993. Amsterdam: North-Holland, 1993.

MLA-Zitierstil (9. Ausg.)

Surface Characterization by LEED, RHEED, REM, STM, and Holography: Proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993. North-Holland, 1993.