Surface characterization by LEED, RHEED, REM, STM, and holography: proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
North-Holland
1993
|
| Schlagworte: | |
| Beschreibung: | In: Surface science. Vol. 298, Nos. 2/3, 1993 |
| Beschreibung: | VI, S. 261 - 495 |
Internformat
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Datensatz im Suchindex
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| physical | VI, S. 261 - 495 |
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| spelling | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 Amsterdam North-Holland 1993 VI, S. 261 - 495 txt rdacontent n rdamedia nc rdacarrier In: Surface science. Vol. 298, Nos. 2/3, 1993 Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Oberflächeneigenschaft (DE-588)4219221-3 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Messtechnik (DE-588)4114575-6 s DE-604 Oberflächenphysik (DE-588)4134881-3 s Oberflächeneigenschaft (DE-588)4219221-3 s Elektronenbeugung (DE-588)4151862-7 s Oberflächenanalyse (DE-588)4172243-7 s 1\p DE-604 Cohen, P. I. Sonstige oth US Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography 1993 Kailua Kona, Hawaii Sonstige (DE-588)5099334-3 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 Elektronenbeugung (DE-588)4151862-7 gnd Oberflächeneigenschaft (DE-588)4219221-3 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Oberflächenphysik (DE-588)4134881-3 gnd Messtechnik (DE-588)4114575-6 gnd |
| subject_GND | (DE-588)4151862-7 (DE-588)4219221-3 (DE-588)4172243-7 (DE-588)4134881-3 (DE-588)4114575-6 (DE-588)1071861417 |
| title | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_auth | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_exact_search | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_exact_search_txtP | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_full | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_fullStr | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_full_unstemmed | Surface characterization by LEED, RHEED, REM, STM, and holography proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| title_short | Surface characterization by LEED, RHEED, REM, STM, and holography |
| title_sort | surface characterization by leed rheed rem stm and holography proceedings of the us japan seminar on surface characterization by electron diffraction reflection electron microscopy and holography kona hawaii 16 19 march 1993 |
| title_sub | proceedings of the US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography ; Kona, Hawaii, 16 - 19 March 1993 |
| topic | Elektronenbeugung (DE-588)4151862-7 gnd Oberflächeneigenschaft (DE-588)4219221-3 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Oberflächenphysik (DE-588)4134881-3 gnd Messtechnik (DE-588)4114575-6 gnd |
| topic_facet | Elektronenbeugung Oberflächeneigenschaft Oberflächenanalyse Oberflächenphysik Messtechnik Konferenzschrift |
| work_keys_str_mv | AT cohenpi surfacecharacterizationbyleedrheedremstmandholographyproceedingsoftheusjapanseminaronsurfacecharacterizationbyelectrondiffractionreflectionelectronmicroscopyandholographykonahawaii1619march1993 AT usjapanseminaronsurfacecharacterizationbyelectrondiffractionreflectionelectronmicroscopyandholographykailuakonahawaii surfacecharacterizationbyleedrheedremstmandholographyproceedingsoftheusjapanseminaronsurfacecharacterizationbyelectrondiffractionreflectionelectronmicroscopyandholographykonahawaii1619march1993 |