Containing papers presented at the International Conference on Ion Beam Surface Layer Analysis: Yorktown Heights, NY, June 18-20, 1973
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Bibliographic Details
Corporate Author: International Conference on Ion Beam Surface Layer Analysis Yorktown Heights, NY (Author)
Format: Conference Proceeding Book
Language:Undetermined
Published: Elsevier Sequoia 1973
Subjects:
Item Description:In: Thin solid films. Vol.19, 1973
Physical Description:VIII, 420 S. Ill., graph. Darst.

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